Chester Lawrence Mallory

Person

Reno, NV, US

People

Patents Grantslast 30 patents

Information Patent Grant
Coin redemption apparatus
- Patent number D434202
- Issue date Nov 21, 2000
- Prometrix Corporation
- Chester L. Mallory
- D99 -
Information Patent Grant
Coin counting and sorting apparatus
- Patent number D432159
- Issue date Oct 17, 2000
- Prometrix Corporation
- Chester L. Mallory
- D18 - Printing and office machinery
Information Patent Grant
Broadband microspectro-reflectometer
- Patent number 5,747,813
- Issue date May 5, 1998
- KLA-Tencop. Corporation
- Adam E. Norton
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Eddy current test method and apparatus for measuring conductance by...
- Patent number 5,552,704
- Issue date Sep 3, 1996
- Tencor Instruments
- Chester L. Mallory
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor surface resistivity probe with semiconductor temperat...
- Patent number 5,260,668
- Issue date Nov 9, 1993
- Prometrix Corporation
- Chester L. Mallory
- G01 - MEASURING TESTING
Information Patent Grant
Confocal scanning optical microscope
- Patent number 5,067,805
- Issue date Nov 26, 1991
- Prometrix Corporation
- Timothy R. Corle
- G02 - OPTICS
Information Patent Grant
Multilevel menu and hierarchy for selecting items and performing ta...
- Patent number 4,951,190
- Issue date Aug 21, 1990
- Prometrix Corporation
- Leslie A. Lane
- G05 - CONTROLLING REGULATING
Information Patent Grant
Autofocusing system for microscope having contrast detection means
- Patent number 4,945,220
- Issue date Jul 31, 1990
- Prometrix Corporation
- Chester L. Mallory
- G02 - OPTICS
Information Patent Grant
Apparatus for handling semiconductor wafers
- Patent number 4,907,931
- Issue date Mar 13, 1990
- Prometrix Corporation
- Chester L. Mallory
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-level dynamic menu which suppresses display of items previous...
- Patent number 4,843,538
- Issue date Jun 27, 1989
- Prometrix Corporation
- Leslie A. Lane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Process control interface system for managing measurement data
- Patent number 4,805,089
- Issue date Feb 14, 1989
- Prometrix Corporation
- Leslie A. Lane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High accuracy film thickness measurement system
- Patent number 4,776,695
- Issue date Oct 11, 1988
- Prometrix Corporation
- Hung van Pham
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for semiconductor wafer testing
- Patent number 4,755,746
- Issue date Jul 5, 1988
- Prometrix Corporation
- Chester Mallory
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for resistivity testing
- Patent number 4,703,252
- Issue date Oct 27, 1987
- Prometrix Corporation
- David S. Perloff
- G01 - MEASURING TESTING
Information Patent Grant
Process control interface system for designer and operator
- Patent number 4,679,137
- Issue date Jul 7, 1987
- Prometrix Corporation
- Leslie A. Lane
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
Modular security enclosure for gaming machine
- Publication number 20050057126
- Publication date Mar 17, 2005
- Prometrix Corporation
- Chester Lawrence Mallory
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Chester Lawrence Mallory

Person

Patents Grantslast 30 patents

Coin redemption apparatus

Coin counting and sorting apparatus

Broadband microspectro-reflectometer

Eddy current test method and apparatus for measuring conductance by...

Semiconductor surface resistivity probe with semiconductor temperat...

Confocal scanning optical microscope

Multilevel menu and hierarchy for selecting items and performing ta...

Autofocusing system for microscope having contrast detection means

Apparatus for handling semiconductor wafers

Multi-level dynamic menu which suppresses display of items previous...

Process control interface system for managing measurement data

High accuracy film thickness measurement system

Apparatus and methods for semiconductor wafer testing

Apparatus and methods for resistivity testing

Process control interface system for designer and operator

Patents Applicationslast 30 patents

Modular security enclosure for gaming machine