Chet V. Lenox

Person

Lexington, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method to weight defects with co-located modeled faults
- Patent number 11,899,065
- Issue date Feb 13, 2024
- KLA Corporation
- David W. Price
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for semiconductor adaptive testing using inline...
- Patent number 11,798,827
- Issue date Oct 24, 2023
- KLA Corporation
- Robert J. Rathert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for identifying latent reliability defects in sem...
- Patent number 11,754,625
- Issue date Sep 12, 2023
- KLA Corporation
- David W. Price
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for evaluating the reliability of semiconductor...
- Patent number 11,656,274
- Issue date May 23, 2023
- KLA Corporation
- Robert J. Rathert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for semiconductor defect-guided burn-in and sys...
- Patent number 11,624,775
- Issue date Apr 11, 2023
- KLA Corporation
- Robert J. Rathert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for Z-PAT defect-guided statistical outlier detec...
- Patent number 11,614,480
- Issue date Mar 28, 2023
- KLA Corporation
- David W. Price
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD TO WEIGHT DEFECTS WITH CO-LOCATED MODELED FAULTS
- Publication number 20230280399
- Publication date Sep 7, 2023
- David W. Price
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR AUTOMATIC DIAGNOSTICS AND MONITORING OF SEMICONDUCTOR DE...
- Publication number 20230236132
- Publication date Jul 27, 2023
- KLA Corporation
- David W. Price
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR SEMICONDUCTOR DEFECT-GUIDED BURN-IN AND SY...
- Publication number 20220390505
- Publication date Dec 8, 2022
- Robert J. Rathert
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR Z-PAT DEFECT-GUIDED STATISTICAL OUTLIER DETEC...
- Publication number 20220390506
- Publication date Dec 8, 2022
- KLA Corporartion
- David W. Price
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR SEMICONDUCTOR ADAPTIVE TESTING USING INLIN...
- Publication number 20220359247
- Publication date Nov 10, 2022
- Robert J. Rathert
- G05 - CONTROLLING REGULATING
Information Patent Application
IMAGING REFLECTOMETRY FOR INLINE SCREENING
- Publication number 20220307990
- Publication date Sep 29, 2022
- John Charles Robinson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR EVALUATING THE RELIABILITY OF SEMICONDUCTOR...
- Publication number 20220260632
- Publication date Aug 18, 2022
- Robert J. Rathert
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR AUTOMATICALLY IDENTIFYING DEFECT-BASED TEST...
- Publication number 20220196723
- Publication date Jun 23, 2022
- David W. Price
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR IDENTIFYING LATENT RELIABILITY DEFECTS IN SEM...
- Publication number 20210239757
- Publication date Aug 5, 2021
- David W. Price
- G01 - MEASURING TESTING

Chet V. Lenox

Person

Patents Grantslast 30 patents

System and method to weight defects with co-located modeled faults

Systems and methods for semiconductor adaptive testing using inline...

System and method for identifying latent reliability defects in sem...

Systems and methods for evaluating the reliability of semiconductor...

Systems and methods for semiconductor defect-guided burn-in and sys...

System and method for Z-PAT defect-guided statistical outlier detec...

Patents Applicationslast 30 patents

SYSTEM AND METHOD TO WEIGHT DEFECTS WITH CO-LOCATED MODELED FAULTS

SYSTEM FOR AUTOMATIC DIAGNOSTICS AND MONITORING OF SEMICONDUCTOR DE...

SYSTEMS AND METHODS FOR SEMICONDUCTOR DEFECT-GUIDED BURN-IN AND SY...

SYSTEM AND METHOD FOR Z-PAT DEFECT-GUIDED STATISTICAL OUTLIER DETEC...

SYSTEMS AND METHODS FOR SEMICONDUCTOR ADAPTIVE TESTING USING INLIN...

IMAGING REFLECTOMETRY FOR INLINE SCREENING

SYSTEMS AND METHODS FOR EVALUATING THE RELIABILITY OF SEMICONDUCTOR...

SYSTEM AND METHOD FOR AUTOMATICALLY IDENTIFYING DEFECT-BASED TEST...

SYSTEM AND METHOD FOR IDENTIFYING LATENT RELIABILITY DEFECTS IN SEM...