Chetana Bhaskar

Follow

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for mixed mode wafer inspection
- Patent number 11,295,438
- Issue date Apr 5, 2022
- KLA Corporation
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High sensitivity repeater defect detection
- Patent number 10,395,358
- Issue date Aug 27, 2019
- KLA-Tencor Corp.
- Bjorn Brauer
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for mixed mode wafer inspection
- Patent number 10,192,303
- Issue date Jan 29, 2019
- KLA-Tencor Corporation
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection recipe setup from reference image variation
- Patent number 9,262,821
- Issue date Feb 16, 2016
- KLA-Tencor Corp.
- Eugene Shifrin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for creating persistent data for a wafer and fo...
- Patent number 8,126,255
- Issue date Feb 28, 2012
- KLA-Tencor Corp.
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron beam inspection system and method
- Patent number 5,502,306
- Issue date Mar 26, 1996
- KLA Instruments Corporation
- Dan Meisburger
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR MIXED MODE WAFER INSPECTION
- Publication number 20220230293
- Publication date Jul 21, 2022
- KLA Corporation
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Mixed Mode Wafer Inspection
- Publication number 20190108630
- Publication date Apr 11, 2019
- KLA-Tencor Corporation
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH SENSITIVITY REPEATER DEFECT DETECTION
- Publication number 20180130199
- Publication date May 10, 2018
- KLA-Tencor Corporation
- Bjorn Brauer
- G01 - MEASURING TESTING
Information Patent Application
Inspection Recipe Setup from Reference Image Variation
- Publication number 20150324964
- Publication date Nov 12, 2015
- KLA-Tencor Corporation
- Eugene Shifrin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Mixed Mode Wafer Inspection
- Publication number 20140153814
- Publication date Jun 5, 2014
- KLA-Tencor Corporation
- Jason Z. Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR CREATING PERSISTENT DATA FOR A WAFER AND FO...
- Publication number 20090080759
- Publication date Mar 26, 2009
- KLA-Tencor Corporation
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING