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Cheul Ock Chae
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Gunsan-si, KR
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Patents Grants
last 30 patents
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Patent Grant
Upper surface foreign material detecting device of ultra-thin trans...
Patent number
9,733,196
Issue date
Aug 15, 2017
Nanoprotech Co., Ltd.
Hyung Seok Lee
G01 - MEASURING TESTING
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Patent Grant
Method of detecting foreign material on upper surface of transparen...
Patent number
9,316,598
Issue date
Apr 19, 2016
Nanoprotech Co., Ltd.
Yeong Ryeol Kim
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Upper Surface Foreign Material Detecting Device of Ultra-Thin Trans...
Publication number
20160327494
Publication date
Nov 10, 2016
Nanoprotech Co., Ltd.
Hyung Seok Lee
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and Method of Detecting Foreign Material on Upper Surface...
Publication number
20150316492
Publication date
Nov 5, 2015
Nanoprotech Co., Ltd.
Yeong Ryeol Kim
G01 - MEASURING TESTING