Chia-Chao KAN

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Taipei, TW

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and analyzing method thereof
- Patent number 11,754,614
- Issue date Sep 12, 2023
- Taiwan Semiconductor Manufacturing Company Ltd.
- Wei-Jhih Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer-level testing method and test structure thereof
- Patent number 11,121,046
- Issue date Sep 14, 2021
- Taiwan Semiconductor Manufacturing Company Ltd.
- Pei-Hsuan Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Ultra-high voltage laterally-diffused MOS devices and methods of fo...
- Patent number 9,184,282
- Issue date Nov 10, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tzu-Ming Huang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND ANALYZING METHOD THEREOF
- Publication number 20220349932
- Publication date Nov 3, 2022
- Taiwan Semiconductor Manufacturing company Ltd.
- WEI-JHIH WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER-LEVEL TESTING METHOD AND TEST STRUCTURE THEREOF
- Publication number 20200043815
- Publication date Feb 6, 2020
- Taiwan Semiconductor Manufacturing company Ltd.
- PEI-HSUAN LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Ultra-High Voltage Laterally-Diffused MOS Devices and Methods of Fo...
- Publication number 20150041891
- Publication date Feb 12, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tzu-Ming Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IP Protection And Control Method Thereof
- Publication number 20110109425
- Publication date May 12, 2011
- National Taiwan University
- Chia-Chao KAN
- G06 - COMPUTING CALCULATING COUNTING