Chia Chun Tseng

Person

Hsinchu City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Method of testing wafer
- Patent number 12,009,302
- Issue date Jun 11, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yen-Hsung Ho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Layout for integrated circuit and the integrated circuit
- Patent number 11,907,633
- Issue date Feb 20, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Cheok-Kei Lei
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Layout for integrated circuit and the integrated circuit
- Patent number 11,494,543
- Issue date Nov 8, 2022
- Taiwan Semiconductor Manufacturing Company Ltd.
- Cheok-Kei Lei
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of testing wafer
- Patent number 11,430,733
- Issue date Aug 30, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yen-Hsung Ho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure, testing and fabricating methods thereof
- Patent number 10,818,595
- Issue date Oct 27, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yen-Hsung Ho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Layout for integrated circuit and the integrated circuit
- Patent number 10,685,162
- Issue date Jun 16, 2020
- Taiwan Semiconductor Manufacturing Company Ltd.
- Cheok-Kei Lei
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of manufacturing semiconductor device having multi-height st...
- Patent number 10,672,777
- Issue date Jun 2, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Kuan-Wei Su
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 10,573,649
- Issue date Feb 25, 2020
- United Microelectronics Corp.
- Chien-Hung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image capturing device and calibration method of phase detection au...
- Patent number 10,235,773
- Issue date Mar 19, 2019
- Altek Semiconductor Corp.
- Yun-Chin Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device having milti-height structure and method of ma...
- Patent number 10,211,214
- Issue date Feb 19, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Kuan-Wei Su
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Layout method for integrated circuit and layout of the integrated c...
- Patent number 10,163,883
- Issue date Dec 25, 2018
- Taiwan Semiconductor Manufacturing Company Ltd.
- Cheok-Kei Lei
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor structure, testing and fabricating method thereof
- Patent number 10,037,927
- Issue date Jul 31, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yen-Hsung Ho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming integrated circuit
- Patent number 9,964,866
- Issue date May 8, 2018
- United Microelectronics Corp.
- Che-Yi Lin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for optimizing depth information
- Patent number 9,747,694
- Issue date Aug 29, 2017
- Altek Semiconductor Corp.
- Yu-Chia Chung
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Overlay mask
- Patent number 9,746,786
- Issue date Aug 29, 2017
- United Microelectronics Corp.
- Che-Yi Lin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of forming non-continuous line pattern and non-continuous li...
- Patent number 9,711,358
- Issue date Jul 18, 2017
- United Microelectronics Corp.
- Yu-Te Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for fabricating the same
- Patent number 9,673,040
- Issue date Jun 6, 2017
- United Microelectronics Corp.
- Yu-Ru Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductive device with a single diffusion break and method of f...
- Patent number 9,660,022
- Issue date May 23, 2017
- UNITED MICROELECTRONICS CORP.
- En-Chiuan Liou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating semiconductor structure with improved critica...
- Patent number 9,653,345
- Issue date May 16, 2017
- United Microelectronics Corp.
- Shang-Nan Chou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure and manufacturing method thereof
- Patent number 9,583,568
- Issue date Feb 28, 2017
- United Microelectronics Corp.
- En-Chiuan Liou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing method of pattern transfer mask
- Patent number 9,581,898
- Issue date Feb 28, 2017
- United Microelectronics Corp.
- En-Chiuan Liou
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of forming non-continuous line pattern and non-continuous li...
- Patent number 9,583,343
- Issue date Feb 28, 2017
- United Microelectronics Corp.
- Yu-Te Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of adjusting channel widths of semiconductive devices
- Patent number 9,548,216
- Issue date Jan 17, 2017
- United Microelectronics Corp.
- Yu-Te Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating a semiconductor structure with a self-aligned...
- Patent number 9,543,203
- Issue date Jan 10, 2017
- United Microelectronics Corp.
- Chia-Lin Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a semiconductor structure
- Patent number 9,530,646
- Issue date Dec 27, 2016
- United Microelectronics Corp.
- Li-Wei Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Overlay mask
- Patent number 9,470,987
- Issue date Oct 18, 2016
- United Microelectronics Corp.
- Che-Yi Lin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for generating depth information
- Patent number 9,406,140
- Issue date Aug 2, 2016
- Altek Semiconductor Corp.
- Yun-Chin Lee
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Image capturing device and digital zoom display method
- Patent number 9,225,909
- Issue date Dec 29, 2015
- Altek Semiconductor Corporation
- Hong-Long Chou
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for adjusting focus position and electronic apparatus
- Patent number 9,179,070
- Issue date Nov 3, 2015
- Altek Semiconductor Corp.
- Che-Lun Chuang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Image adjusting system with multiple lens modules and method thereof
- Patent number 9,113,083
- Issue date Aug 18, 2015
- Altek Semiconductor Corporation
- Hong-Long Chou
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
PROCESSING METHOD AND SYSTEM FOR TRACHEAL INTUBATION IMAGES, AND EF...
- Publication number 20250037276
- Publication date Jan 30, 2025
- Chia-Chih TSENG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICES WITH IMPROVED GATE CONTROL
- Publication number 20250022940
- Publication date Jan 16, 2025
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Che-Chun LU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES WITH IMPROVED LEAKAGE CURRENT CONTROL
- Publication number 20240429285
- Publication date Dec 26, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Che-Chun LU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ACTIVE REGION TRIMMING AFTER FORMATION OF SOURCE/DRAIN COMPONENTS
- Publication number 20240429304
- Publication date Dec 26, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Che-Chun Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NOISE TRANSISTOR
- Publication number 20240421228
- Publication date Dec 19, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Che-Chun Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LAYOUT FOR INTEGRATED CIRCUIT AND THE INTEGRATED CIRCUIT
- Publication number 20220382948
- Publication date Dec 1, 2022
- Taiwan Semiconductor Manufacturing company Ltd.
- CHEOK-KEI LEI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF TESTING WAFER
- Publication number 20220359395
- Publication date Nov 10, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yen-Hsung Ho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF TESTING WAFER
- Publication number 20210043566
- Publication date Feb 11, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yen-Hsung Ho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LAYOUT FOR INTEGRATED CIRCUIT AND THE INTEGRATED CIRCUIT
- Publication number 20200285797
- Publication date Sep 10, 2020
- Taiwan Semiconductor Manufacturing company Ltd.
- CHEOK-KEI LEI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE HAVING MULTI-HEIGHT ST...
- Publication number 20190181149
- Publication date Jun 13, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Kuan-Wei SU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LAYOUT FOR INTEGRATED CIRCUIT AND THE INTEGRATED CIRCUIT
- Publication number 20190121931
- Publication date Apr 25, 2019
- Taiwan Semiconductor Manufacturing company Ltd.
- CHEOK-KEI LEI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE HAVING MILTI-HEIGHT STRUCTURE AND METHOD OF MA...
- Publication number 20180261609
- Publication date Sep 13, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Kuan-Wei SU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE CAPTURING DEVICE AND CALIBRATION METHOD OF PHASE DETECTION AU...
- Publication number 20180183991
- Publication date Jun 28, 2018
- Altek Semiconductor Corp.
- Yun-Chin Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR STRUCTURE, TESTING AND FABRICATING METHOD THEREOF
- Publication number 20180151459
- Publication date May 31, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yen-Hsung Ho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE, TESTING AND FABRICATING METHODS THEREOF
- Publication number 20180151458
- Publication date May 31, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yen-Hsung Ho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LAYOUT METHOD FOR INTEGRATED CIRCUIT AND LAYOUT OF THE INTEGRATED C...
- Publication number 20170365592
- Publication date Dec 21, 2017
- Taiwan Semiconductor Manufacturing company Ltd.
- CHEOK-KEI LEI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF FORMING INTEGRATED CIRCUIT
- Publication number 20170220728
- Publication date Aug 3, 2017
- UNITED MICROELECTRONICS CORP.
- Che-Yi Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20170200721
- Publication date Jul 13, 2017
- UNITED MICROELECTRONICS CORP.
- Chien-Hung Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING NON-CONTINUOUS LINE PATTERN AND NON-CONTINUOUS LI...
- Publication number 20170117149
- Publication date Apr 27, 2017
- UNITED MICROELECTRONICS CORP.
- Yu-Te Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OVERLAY MASK
- Publication number 20170115579
- Publication date Apr 27, 2017
- UNITED MICROELECTRONICS CORP.
- Che-Yi Lin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SEMICONDUCTIVE DEVICE WITH A SINGLE DIFFUSION BREAK AND METHOD OF F...
- Publication number 20170053980
- Publication date Feb 23, 2017
- UNITED MICROELECTRONICS CORP.
- En-Chiuan Liou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF ADJUSTING CHANNEL WIDTHS OF SEMICONDUCTIVE DEVICES
- Publication number 20170025286
- Publication date Jan 26, 2017
- UNITED MICROELECTRONICS CORP.
- Yu-Te Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FABRICATING A SEMICONDUCTOR STRUCTURE WITH A SELF-ALIGNED...
- Publication number 20170004997
- Publication date Jan 5, 2017
- UNITED MICROELECTRONICS CORP.
- Chia-Lin Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING NON-CONTINUOUS LINE PATTERN AND NON-CONTINUOUS LI...
- Publication number 20160343567
- Publication date Nov 24, 2016
- UNITED MICROELECTRONICS CORP.
- Yu-Te Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MANUFACTURING METHOD OF PATTERN TRANSFER MASK
- Publication number 20160306274
- Publication date Oct 20, 2016
- UNITED MICROELECTRONICS CORP.
- En-Chiuan Liou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING A SEMICONDUCTOR STRUCTURE
- Publication number 20160247678
- Publication date Aug 25, 2016
- UNITED MICROELECTRONICS CORP.
- Li-Wei Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF
- Publication number 20160204197
- Publication date Jul 14, 2016
- UNITED MICROELECTRONICS CORP.
- En-Chiuan Liou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
- Publication number 20160126139
- Publication date May 5, 2016
- UNITED MICROELECTRONICS CORP.
- Yu-Ru Yang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE CAPTURING DEVICE AND DIGITAL ZOOM METHOD
- Publication number 20160080657
- Publication date Mar 17, 2016
- ALTEK SEMICONDUCTOR CORPORATION
- Hong-Long CHOU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR OPTIMIZING DEPTH INFORMATION
- Publication number 20150319421
- Publication date Nov 5, 2015
- Altek Semiconductor Corp.
- Yu-Chia Chung
- G06 - COMPUTING CALCULATING COUNTING

Chia Chun Tseng

Person

Patents Grantslast 30 patents

Method of testing wafer

Layout for integrated circuit and the integrated circuit

Layout for integrated circuit and the integrated circuit

Method of testing wafer

Semiconductor structure, testing and fabricating methods thereof

Layout for integrated circuit and the integrated circuit

Method of manufacturing semiconductor device having multi-height st...

Semiconductor device and manufacturing method thereof

Image capturing device and calibration method of phase detection au...

Semiconductor device having milti-height structure and method of ma...

Layout method for integrated circuit and layout of the integrated c...

Semiconductor structure, testing and fabricating method thereof

Method of forming integrated circuit

Method and apparatus for optimizing depth information

Overlay mask

Method of forming non-continuous line pattern and non-continuous li...

Semiconductor device and method for fabricating the same

Semiconductive device with a single diffusion break and method of f...

Method of fabricating semiconductor structure with improved critica...

Semiconductor structure and manufacturing method thereof

Manufacturing method of pattern transfer mask

Method of forming non-continuous line pattern and non-continuous li...

Method of adjusting channel widths of semiconductive devices

Method of fabricating a semiconductor structure with a self-aligned...

Method of forming a semiconductor structure

Overlay mask

Method and apparatus for generating depth information

Image capturing device and digital zoom display method

Method for adjusting focus position and electronic apparatus

Image adjusting system with multiple lens modules and method thereof

Patents Applicationslast 30 patents

PROCESSING METHOD AND SYSTEM FOR TRACHEAL INTUBATION IMAGES, AND EF...

SEMICONDUCTOR DEVICES WITH IMPROVED GATE CONTROL

SEMICONDUCTOR DEVICES WITH IMPROVED LEAKAGE CURRENT CONTROL

ACTIVE REGION TRIMMING AFTER FORMATION OF SOURCE/DRAIN COMPONENTS

NOISE TRANSISTOR

LAYOUT FOR INTEGRATED CIRCUIT AND THE INTEGRATED CIRCUIT

METHOD OF TESTING WAFER

METHOD OF TESTING WAFER

LAYOUT FOR INTEGRATED CIRCUIT AND THE INTEGRATED CIRCUIT

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE HAVING MULTI-HEIGHT ST...

LAYOUT FOR INTEGRATED CIRCUIT AND THE INTEGRATED CIRCUIT

SEMICONDUCTOR DEVICE HAVING MILTI-HEIGHT STRUCTURE AND METHOD OF MA...

IMAGE CAPTURING DEVICE AND CALIBRATION METHOD OF PHASE DETECTION AU...

SEMICONDUCTOR STRUCTURE, TESTING AND FABRICATING METHOD THEREOF

SEMICONDUCTOR STRUCTURE, TESTING AND FABRICATING METHODS THEREOF

LAYOUT METHOD FOR INTEGRATED CIRCUIT AND LAYOUT OF THE INTEGRATED C...

METHOD OF FORMING INTEGRATED CIRCUIT

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

METHOD OF FORMING NON-CONTINUOUS LINE PATTERN AND NON-CONTINUOUS LI...

OVERLAY MASK

SEMICONDUCTIVE DEVICE WITH A SINGLE DIFFUSION BREAK AND METHOD OF F...

METHOD OF ADJUSTING CHANNEL WIDTHS OF SEMICONDUCTIVE DEVICES

METHOD OF FABRICATING A SEMICONDUCTOR STRUCTURE WITH A SELF-ALIGNED...

METHOD OF FORMING NON-CONTINUOUS LINE PATTERN AND NON-CONTINUOUS LI...

MANUFACTURING METHOD OF PATTERN TRANSFER MASK

METHOD OF FORMING A SEMICONDUCTOR STRUCTURE

SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF

SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

IMAGE CAPTURING DEVICE AND DIGITAL ZOOM METHOD

METHOD AND APPARATUS FOR OPTIMIZING DEPTH INFORMATION