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Chia-Gee Wang
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Millwood, NY, US
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last 30 patents
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Patent Grant
X-ray tube and microelectronics alignment process
Patent number
5,627,871
Issue date
May 6, 1997
Nanodynamics, Inc.
Chia-Gee Wang
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method and apparatus for investigating materials with X-rays
Patent number
5,044,001
Issue date
Aug 27, 1991
Nanod Ynamics, Inc.
Chia-Gee Wang
G01 - MEASURING TESTING
Information
Patent Grant
Virus detection method and materials
Patent number
4,663,277
Issue date
May 5, 1987
Profile Diagnostic Sciences Inc.
Chia-Gee Wang
G01 - MEASURING TESTING
Information
Patent Grant
Method of tagged immunoassay
Patent number
4,454,233
Issue date
Jun 12, 1984
Wang Associates
Chia-Gee Wang
G01 - MEASURING TESTING
Information
Patent Grant
Tagged immunoassay
Patent number
4,436,826
Issue date
Mar 13, 1984
Wang Associates
Chia-Gee Wang
G01 - MEASURING TESTING
Information
Patent Grant
Auger microlithography with regard to Auger window
Patent number
4,425,423
Issue date
Jan 10, 1984
Chia-Gee Wang
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Detection of atoms using monochromatic X-rays
Patent number
4,382,181
Issue date
May 3, 1983
Chia-Gee Wang
G01 - MEASURING TESTING
Information
Patent Grant
Auger microlithography
Patent number
4,350,755
Issue date
Sep 21, 1982
Chia-Gee Wang
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Scanning X-ray microscope
Patent number
4,317,036
Issue date
Feb 23, 1982
Chia-Gee Wang
G01 - MEASURING TESTING
Information
Patent Grant
Detection of atoms using monochromatic X-rays
Patent number
4,239,966
Issue date
Dec 16, 1980
Chia G. Wang
G01 - MEASURING TESTING