Chia-Hung CHO

Person

Hsinchu City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Method of training AI for label-free cell viability determination a...
- Patent number 12,099,053
- Issue date Sep 24, 2024
- Industrial Technology Research Institute
- Hsiang-Chun Wei
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical measurement system for obtaining and analyzing surface topo...
- Patent number 11,507,020
- Issue date Nov 22, 2022
- Industrial Technology Research Institute
- Hsiang-Chun Wei
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimension measurement device and operation method thereof
- Patent number 11,248,903
- Issue date Feb 15, 2022
- Industrial Technology Research Institute
- Chia-Hung Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection system for a multilayer film and method thereof using dua...
- Patent number 10,429,318
- Issue date Oct 1, 2019
- Industrial Technology Research Institute
- Ding-Kun Liu
- G01 - MEASURING TESTING
Information Patent Grant
Structured light generating device and measuring system and method
- Patent number 10,105,906
- Issue date Oct 23, 2018
- Industrial Technology Research Institute
- Chia-Hung Cho
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Three-dimensional measurement system and method thereof
- Patent number 10,002,439
- Issue date Jun 19, 2018
- Industrial Technology Research Institute
- Chia-Hung Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface measurement device and method thereof
- Patent number 9,970,754
- Issue date May 15, 2018
- Industrial Technology Research Institute
- Chia-Hung Cho
- B24 - GRINDING POLISHING
Information Patent Grant
Surface measuring device and method thereof
- Patent number 9,835,449
- Issue date Dec 5, 2017
- Industrial Technology Research Institute
- Chia-Hung Cho
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system
- Patent number 9,752,866
- Issue date Sep 5, 2017
- Industrial Technology Research Institute
- Hsiang-Chun Wei
- G01 - MEASURING TESTING
Information Patent Grant
Temperature sensing apparatus, laser processing system, and tempera...
- Patent number 9,533,375
- Issue date Jan 3, 2017
- Industrial Technology Research Institute
- Chia-Hung Cho
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Display measuring device
- Patent number 8,912,483
- Issue date Dec 16, 2014
- Industrial Technology Research Institute
- Yu-Shan Chang
- G01 - MEASURING TESTING
Information Patent Grant
System and method for constructing high resolution images
- Patent number 8,581,979
- Issue date Nov 12, 2013
- Industrial Technology Research Institute
- Sen Yih Chou
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE DEPTH-MEASURING DEVICE AND METHOD
- Publication number 20240331178
- Publication date Oct 3, 2024
- Industrial Technology Research Institute
- Chia-Hung CHO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF TRAINING AI FOR LABEL-FREE CELL VIABILITY DETERMINATION A...
- Publication number 20230160879
- Publication date May 25, 2023
- Industrial Technology Research Institute
- Hsiang-Chun WEI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT APPLICABLE TO PERFORMING SYSTEM PROTECTION THROU...
- Publication number 20220222385
- Publication date Jul 14, 2022
- Realtek Semiconductor Corp.
- Chang-Hsien Tai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL MEASUREMENT SYSTEM
- Publication number 20210149337
- Publication date May 20, 2021
- Industrial Technology Research Institute
- Hsiang-Chun WEI
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSION MEASUREMENT DEVICE AND OPERATION METHOD THEREOF
- Publication number 20210080252
- Publication date Mar 18, 2021
- Industrial Technology Research Institute
- Chia-Hung CHO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTION SYSTEM FOR A MULTILAYER FILM AND METHOD THEREOF
- Publication number 20190187067
- Publication date Jun 20, 2019
- Industrial Technology Research Institute
- Ding-Kun Liu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
THREE-DIMENSIONAL MEASUREMENT SYSTEM AND METHOD THEREOF
- Publication number 20180137637
- Publication date May 17, 2018
- Industrial Technology Research Institute
- Chia-Hung CHO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT SYSTEM
- Publication number 20170146339
- Publication date May 25, 2017
- Industrial Technology Research Institute
- Hsiang-Chun WEI
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURED LIGHT GENERATING DEVICE AND MEASURING SYSTEM AND METHOD
- Publication number 20170066192
- Publication date Mar 9, 2017
- Industrial Technology Research Institute
- Chia-Hung Cho
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Application
SURFACE MEASUREMENT DEVICE AND METHOD THEREOF
- Publication number 20170059311
- Publication date Mar 2, 2017
- Industrial Technology Research Institute
- Chia-Hung CHO
- G01 - MEASURING TESTING
Information Patent Application
SURFACE MEASURING DEVICE AND METHOD THEREOF
- Publication number 20170059310
- Publication date Mar 2, 2017
- Industrial Technology Research Institute
- Chia-Hung CHO
- G01 - MEASURING TESTING
Information Patent Application
SCATTERING MEASUREMENT SYSTEM AND METHOD
- Publication number 20170045355
- Publication date Feb 16, 2017
- Industrial Technology Research Institute
- Yi-Chen HSIEH
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE SENSING APPARATUS, LASER PROCESSING SYSTEM, AND TEMPERA...
- Publication number 20160096236
- Publication date Apr 7, 2016
- Industrial Technology Research Institute
- Chia-Hung Cho
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
THICKNESS MEASURING SYSTEM AND METHOD FOR A BONDING LAYER
- Publication number 20140333936
- Publication date Nov 13, 2014
- Industrial Technology Research Institute
- Po-Yi CHANG
- G01 - MEASURING TESTING
Information Patent Application
DISPLAY MEASURING DEVICE
- Publication number 20140175270
- Publication date Jun 26, 2014
- Industrial Technology Research Institute
- Yu-Shan Chang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEM AND METHOD FOR CONSTRUCTING HIGH RESOLUTION IMAGES
- Publication number 20120154574
- Publication date Jun 21, 2012
- Industrial Technology Research Institute
- Sen Yih CHOU
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Chia-Hung CHO

Person

Patents Grantslast 30 patents

Method of training AI for label-free cell viability determination a...

Optical measurement system for obtaining and analyzing surface topo...

Three-dimension measurement device and operation method thereof

Detection system for a multilayer film and method thereof using dua...

Structured light generating device and measuring system and method

Three-dimensional measurement system and method thereof

Surface measurement device and method thereof

Surface measuring device and method thereof

Measurement system

Temperature sensing apparatus, laser processing system, and tempera...

Display measuring device

System and method for constructing high resolution images

Patents Applicationslast 30 patents

SAMPLE DEPTH-MEASURING DEVICE AND METHOD

METHOD OF TRAINING AI FOR LABEL-FREE CELL VIABILITY DETERMINATION A...

INTEGRATED CIRCUIT APPLICABLE TO PERFORMING SYSTEM PROTECTION THROU...

OPTICAL MEASUREMENT SYSTEM

THREE-DIMENSION MEASUREMENT DEVICE AND OPERATION METHOD THEREOF

DETECTION SYSTEM FOR A MULTILAYER FILM AND METHOD THEREOF

THREE-DIMENSIONAL MEASUREMENT SYSTEM AND METHOD THEREOF

MEASUREMENT SYSTEM

STRUCTURED LIGHT GENERATING DEVICE AND MEASURING SYSTEM AND METHOD

SURFACE MEASUREMENT DEVICE AND METHOD THEREOF

SURFACE MEASURING DEVICE AND METHOD THEREOF

SCATTERING MEASUREMENT SYSTEM AND METHOD

TEMPERATURE SENSING APPARATUS, LASER PROCESSING SYSTEM, AND TEMPERA...

THICKNESS MEASURING SYSTEM AND METHOD FOR A BONDING LAYER

DISPLAY MEASURING DEVICE

SYSTEM AND METHOD FOR CONSTRUCTING HIGH RESOLUTION IMAGES