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Chia-Hung CHO
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Hsinchu City, TW
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Patents Grants
last 30 patents
Information
Patent Grant
Optical measurement system for obtaining and analyzing surface topo...
Patent number
11,507,020
Issue date
Nov 22, 2022
Industrial Technology Research Institute
Hsiang-Chun Wei
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Three-dimension measurement device and operation method thereof
Patent number
11,248,903
Issue date
Feb 15, 2022
Industrial Technology Research Institute
Chia-Hung Cho
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Detection system for a multilayer film and method thereof using dua...
Patent number
10,429,318
Issue date
Oct 1, 2019
Industrial Technology Research Institute
Ding-Kun Liu
G01 - MEASURING TESTING
Information
Patent Grant
Structured light generating device and measuring system and method
Patent number
10,105,906
Issue date
Oct 23, 2018
Industrial Technology Research Institute
Chia-Hung Cho
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Three-dimensional measurement system and method thereof
Patent number
10,002,439
Issue date
Jun 19, 2018
Industrial Technology Research Institute
Chia-Hung Cho
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Surface measurement device and method thereof
Patent number
9,970,754
Issue date
May 15, 2018
Industrial Technology Research Institute
Chia-Hung Cho
B24 - GRINDING POLISHING
Information
Patent Grant
Surface measuring device and method thereof
Patent number
9,835,449
Issue date
Dec 5, 2017
Industrial Technology Research Institute
Chia-Hung Cho
G01 - MEASURING TESTING
Information
Patent Grant
Measurement system
Patent number
9,752,866
Issue date
Sep 5, 2017
Industrial Technology Research Institute
Hsiang-Chun Wei
G01 - MEASURING TESTING
Information
Patent Grant
Temperature sensing apparatus, laser processing system, and tempera...
Patent number
9,533,375
Issue date
Jan 3, 2017
Industrial Technology Research Institute
Chia-Hung Cho
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Display measuring device
Patent number
8,912,483
Issue date
Dec 16, 2014
Industrial Technology Research Institute
Yu-Shan Chang
G01 - MEASURING TESTING
Information
Patent Grant
System and method for constructing high resolution images
Patent number
8,581,979
Issue date
Nov 12, 2013
Industrial Technology Research Institute
Sen Yih Chou
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF TRAINING AI FOR LABEL-FREE CELL VIABILITY DETERMINATION A...
Publication number
20230160879
Publication date
May 25, 2023
Industrial Technology Research Institute
Hsiang-Chun WEI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INTEGRATED CIRCUIT APPLICABLE TO PERFORMING SYSTEM PROTECTION THROU...
Publication number
20220222385
Publication date
Jul 14, 2022
Realtek Semiconductor Corp.
Chang-Hsien Tai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OPTICAL MEASUREMENT SYSTEM
Publication number
20210149337
Publication date
May 20, 2021
Industrial Technology Research Institute
Hsiang-Chun WEI
G01 - MEASURING TESTING
Information
Patent Application
THREE-DIMENSION MEASUREMENT DEVICE AND OPERATION METHOD THEREOF
Publication number
20210080252
Publication date
Mar 18, 2021
Industrial Technology Research Institute
Chia-Hung CHO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DETECTION SYSTEM FOR A MULTILAYER FILM AND METHOD THEREOF
Publication number
20190187067
Publication date
Jun 20, 2019
Industrial Technology Research Institute
Ding-Kun Liu
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
THREE-DIMENSIONAL MEASUREMENT SYSTEM AND METHOD THEREOF
Publication number
20180137637
Publication date
May 17, 2018
Industrial Technology Research Institute
Chia-Hung CHO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEASUREMENT SYSTEM
Publication number
20170146339
Publication date
May 25, 2017
Industrial Technology Research Institute
Hsiang-Chun WEI
G01 - MEASURING TESTING
Information
Patent Application
STRUCTURED LIGHT GENERATING DEVICE AND MEASURING SYSTEM AND METHOD
Publication number
20170066192
Publication date
Mar 9, 2017
Industrial Technology Research Institute
Chia-Hung Cho
B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information
Patent Application
SURFACE MEASUREMENT DEVICE AND METHOD THEREOF
Publication number
20170059311
Publication date
Mar 2, 2017
Industrial Technology Research Institute
Chia-Hung CHO
G01 - MEASURING TESTING
Information
Patent Application
SURFACE MEASURING DEVICE AND METHOD THEREOF
Publication number
20170059310
Publication date
Mar 2, 2017
Industrial Technology Research Institute
Chia-Hung CHO
G01 - MEASURING TESTING
Information
Patent Application
SCATTERING MEASUREMENT SYSTEM AND METHOD
Publication number
20170045355
Publication date
Feb 16, 2017
Industrial Technology Research Institute
Yi-Chen HSIEH
G01 - MEASURING TESTING
Information
Patent Application
TEMPERATURE SENSING APPARATUS, LASER PROCESSING SYSTEM, AND TEMPERA...
Publication number
20160096236
Publication date
Apr 7, 2016
Industrial Technology Research Institute
Chia-Hung Cho
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
THICKNESS MEASURING SYSTEM AND METHOD FOR A BONDING LAYER
Publication number
20140333936
Publication date
Nov 13, 2014
Industrial Technology Research Institute
Po-Yi CHANG
G01 - MEASURING TESTING
Information
Patent Application
DISPLAY MEASURING DEVICE
Publication number
20140175270
Publication date
Jun 26, 2014
Industrial Technology Research Institute
Yu-Shan Chang
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
SYSTEM AND METHOD FOR CONSTRUCTING HIGH RESOLUTION IMAGES
Publication number
20120154574
Publication date
Jun 21, 2012
Industrial Technology Research Institute
Sen Yih CHOU
H04 - ELECTRIC COMMUNICATION TECHNIQUE