Chia-Wei SOONG

Person

Taoyuan, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Method and structure for FinFET devices
- Patent number 11,855,089
- Issue date Dec 26, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yong-Yan Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and structure for FinFET devices
- Patent number 11,569,230
- Issue date Jan 31, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yong-Yan Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fin field effect transistor (FinFET) device structure and method fo...
- Patent number 11,107,810
- Issue date Aug 31, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chih-Pin Tsao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and structure for FinFET devices
- Patent number 10,797,052
- Issue date Oct 6, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yong-Yan Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 10,276,568
- Issue date Apr 30, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yu-Sheng Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fluorine contamination control in semiconductor manufacturing process
- Patent number 10,262,878
- Issue date Apr 16, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Li-Jung Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and structure for FinFET devices
- Patent number 10,157,924
- Issue date Dec 18, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yong-Yan Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fluorine contamination control in semiconductor manufacturing process
- Patent number 10,109,507
- Issue date Oct 23, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd
- Li-Jung Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 9,947,658
- Issue date Apr 17, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yu-Sheng Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 9,831,242
- Issue date Nov 28, 2017
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chia-Wei Soong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and structure for FinFET devices
- Patent number 9,553,172
- Issue date Jan 24, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yong-Yan Lu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND STRUCTURE FOR FINFET DEVICES
- Publication number 20220302113
- Publication date Sep 22, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yong-Yan Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND STRUCTURE FOR FINFET DEVICES
- Publication number 20210020634
- Publication date Jan 21, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yong-Yan Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIN FIELD EFFECT TRANSISTOR (FINFET) DEVICE STRUCTURE AND METHOD FO...
- Publication number 20200091146
- Publication date Mar 19, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chih-Pin TSAO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Structure for FinFET Devices
- Publication number 20190123049
- Publication date Apr 25, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yong-Yan Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLUORINE CONTAMINATION CONTROL IN SEMICONDUCTOR MANUFACTURING PROCESS
- Publication number 20190051542
- Publication date Feb 14, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Li-Jung LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20180190654
- Publication date Jul 5, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yu-Sheng WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLUORINE CONTAMINATION CONTROL IN SEMICONDUCTOR MANUFACTURING PROCESS
- Publication number 20170352559
- Publication date Dec 7, 2017
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Li-Jung LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Structure for FinFET Devices
- Publication number 20170133371
- Publication date May 11, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yong-Yan Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20170125413
- Publication date May 4, 2017
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yu-Sheng WU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20170125412
- Publication date May 4, 2017
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chia-Wei SOONG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Structure for FinFET Devices
- Publication number 20160233319
- Publication date Aug 11, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yong-Yan Lu
- H01 - BASIC ELECTRIC ELEMENTS

Chia-Wei SOONG

Person

Patents Grantslast 30 patents

Method and structure for FinFET devices

Method and structure for FinFET devices

Fin field effect transistor (FinFET) device structure and method fo...

Method and structure for FinFET devices

Semiconductor device and manufacturing method thereof

Fluorine contamination control in semiconductor manufacturing process

Method and structure for FinFET devices

Fluorine contamination control in semiconductor manufacturing process

Semiconductor device and manufacturing method thereof

Semiconductor device and manufacturing method thereof

Method and structure for FinFET devices

Patents Applicationslast 30 patents

METHOD AND STRUCTURE FOR FINFET DEVICES

METHOD AND STRUCTURE FOR FINFET DEVICES

FIN FIELD EFFECT TRANSISTOR (FINFET) DEVICE STRUCTURE AND METHOD FO...

Method and Structure for FinFET Devices

FLUORINE CONTAMINATION CONTROL IN SEMICONDUCTOR MANUFACTURING PROCESS

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

FLUORINE CONTAMINATION CONTROL IN SEMICONDUCTOR MANUFACTURING PROCESS

Method and Structure for FinFET Devices

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

Method and Structure for FinFET Devices