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Chia-Yun Chen

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  • Kao-Hsiung Hsien, TW
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Patents Grantslast 30 patents

  • Information Patent Grant

    Method of managing wafer defects
    • Patent number 7,412,090
    • Issue date Aug 12, 2008
    • Powerchip Semiconductor Corp.
    • Hung-En Tai
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents