Chiaki Mochizuki

Follow

Person

Nirasaki-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Probe card transfer assist apparatus, and inspection equipment and...
- Patent number 7,541,801
- Issue date Jun 2, 2009
- Tokyo Electron Limited
- Munetoshi Nagasaka
- G01 - MEASURING TESTING
Information Patent Grant
Probe card transfer assist apparatus and inspection equipment using...
- Patent number 7,528,620
- Issue date May 5, 2009
- Tokyo Electron Limited
- Chiaki Mochizuki
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus
- Patent number 6,262,570
- Issue date Jul 17, 2001
- Tokyo Electron Limited
- Yutaka Akaike
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus
- Patent number 5,912,555
- Issue date Jun 15, 1999
- Tokyo Electron Limited
- Yutaka Akaike
- G01 - MEASURING TESTING
Information Patent Grant
Probe card assembly and method of manufacturing probe card assembly
- Patent number 5,521,523
- Issue date May 28, 1996
- Tokyo Electron Limited
- Hidetoshi Kimura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD TRANSFER ASSIST APPARATUS AND INSPECTION EQUIPMENT USING...
- Publication number 20070126441
- Publication date Jun 7, 2007
- TOKYO ELECTRON LIMITED
- Chiaki Mochizuki
- G01 - MEASURING TESTING
Information Patent Application
Probe card transfer assist apparatus, and inspection equipment and...
- Publication number 20070063720
- Publication date Mar 22, 2007
- TOKYO ELECTRON LIMITED
- Munetoshi Nagasaka
- G01 - MEASURING TESTING