Chiaki Yasumuro

Follow

Person

Chiba, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Microprobe and sample surface measuring apparatus
- Patent number 6,664,540
- Issue date Dec 16, 2003
- Seiko Instruments Inc.
- Nobuhiro Shimizu
- G01 - MEASURING TESTING
Information Patent Grant
Multiprobe and scanning probe microscope
- Patent number 6,469,293
- Issue date Oct 22, 2002
- Seiko Instruments Inc.
- Nobuhiro Shimizu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Self-exciting and self-detecting probe and scanning probe apparatus
- Patent number 6,422,069
- Issue date Jul 23, 2002
- Seiko Instruments Inc.
- Nobuhiro Shimizu
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Microprobe and sample surface measuring apparatus
- Publication number 20010028033
- Publication date Oct 11, 2001
- Nobuhiro Shimizu
- B82 - NANO-TECHNOLOGY