Chidane Ouchi

Person

Utsunomiya-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray imaging apparatus and wavefront measuring apparatus
- Patent number 9,107,637
- Issue date Aug 18, 2015
- Canon Kabushiki Kaisha
- Chidane Ouchi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray imaging apparatus
- Patent number 9,066,704
- Issue date Jun 30, 2015
- Canon Kabushiki Kaisha
- Toru Den
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray imaging apparatus
- Patent number 9,063,055
- Issue date Jun 23, 2015
- Canon Kabushiki Kaisha
- Chidane Ouchi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray imaging apparatus
- Patent number 9,046,466
- Issue date Jun 2, 2015
- Canon Kabushiki Kaisha
- Chidane Ouchi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Absolute position measurement apparatus and method
- Patent number 9,043,182
- Issue date May 26, 2015
- Canon Kabushiki Kaisha
- Yuzo Seo
- G01 - MEASURING TESTING
Information Patent Grant
X-ray imaging apparatus
- Patent number 8,995,613
- Issue date Mar 31, 2015
- Canon Kabushiki Kaisha
- Chidane Ouchi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Imaging apparatus and imaging method
- Patent number 8,559,594
- Issue date Oct 15, 2013
- Canon Kabushiki Kaisha
- Chidane Ouchi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray imaging apparatus, X-ray imaging method, and X-ray imaging pr...
- Patent number 8,537,966
- Issue date Sep 17, 2013
- Canon Kabushiki Kaisha
- Chidane Ouchi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Talbot interferometer, its adjustment method, and measurement method
- Patent number 8,520,217
- Issue date Aug 27, 2013
- Canon Kabushiki Kaisha
- Toshiyuki Naoi
- G01 - MEASURING TESTING
Information Patent Grant
Wavefront-aberration-measuring device and exposure apparatus
- Patent number 8,351,050
- Issue date Jan 8, 2013
- Canon Kabushiki Kaisha
- Chidane Ouchi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray imaging apparatus, X-ray imaging method, and X-ray imaging pr...
- Patent number 8,340,243
- Issue date Dec 25, 2012
- Canon Kabushiki Kaisha
- Chidane Ouchi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Wavefront aberration measuring method, mask, wavefront aberration m...
- Patent number 8,077,391
- Issue date Dec 13, 2011
- Canon Kabushiki Kaisha
- Chidane Ouchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
X-ray imaging apparatus, X-ray imaging method, and X-ray imaging pr...
- Patent number 8,009,797
- Issue date Aug 30, 2011
- Canon Kabushiki Kaisha
- Chidane Ouchi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Measuring apparatus, exposure apparatus and method, and device manu...
- Patent number 8,004,691
- Issue date Aug 23, 2011
- Canon Kabushiki Kaisha
- Chidane Ouchi
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus, exposure apparatus having the same, and devi...
- Patent number 7,952,726
- Issue date May 31, 2011
- Canon Kabushiki Kaisha
- Seima Kato
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Measuring method and apparatus using shearing interferometry, expos...
- Patent number 7,253,907
- Issue date Aug 7, 2007
- Canon Kabushiki Kaisha
- Chidane Ouchi
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device and measuring method
- Patent number 7,106,452
- Issue date Sep 12, 2006
- Canon Kabushiki Kaisha
- Chidane Ouchi
- G01 - MEASURING TESTING
Information Patent Grant
Interference system and semiconductor exposure apparatus having the...
- Patent number 6,961,132
- Issue date Nov 1, 2005
- Canon Kabushiki Kaisha
- Chidane Ouchi
- G01 - MEASURING TESTING
Information Patent Grant
Projection exposure apparatus and device manufacturing method that...
- Patent number 6,853,442
- Issue date Feb 8, 2005
- Canon Kabushiki Kaisha
- Chidane Ouchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Exposure apparatus and device manufacturing method using the same
- Patent number 6,774,982
- Issue date Aug 10, 2004
- Canon Kabushiki Kaisha
- Chidane Ouchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Surface shape measuring apparatus and method
- Patent number 6,721,056
- Issue date Apr 13, 2004
- Canon Kabushiki Kaisha
- Akihiro Nakauchi
- G01 - MEASURING TESTING
Information Patent Grant
Interference system and semiconductor exposure apparatus having the...
- Patent number 6,661,522
- Issue date Dec 9, 2003
- Canon Kabushiki Kaisha
- Chidane Ouchi
- G01 - MEASURING TESTING
Information Patent Grant
Exposure apparatus and device manufacturing method using the same
- Patent number 6,322,220
- Issue date Nov 27, 2001
- Canon Kabushiki Kaisha
- Naoto Sano
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Illuminance distribution measuring system
- Patent number 5,067,811
- Issue date Nov 26, 1991
- Canon Kabushiki Kaisha
- Chidane Ouchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
X-RAY IMAGING APPARATUS
- Publication number 20150279497
- Publication date Oct 1, 2015
- Canon Kabushiki Kaisha
- Toru Den
- G01 - MEASURING TESTING
Information Patent Application
X-RAY TALBOT INTERFEROMETER AND X-RAY TALBOT IMAGING SYSTEM
- Publication number 20140270060
- Publication date Sep 18, 2014
- Canon Kabushiki Kaisha
- Takashi Date
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IMAGING APPARATUS
- Publication number 20130070895
- Publication date Mar 21, 2013
- Canon Kabushiki Kaisha
- Chidane Ouchi
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IMAGING APPARATUS, X-RAY IMAGING METHOD, AND X-RAY IMAGING PR...
- Publication number 20130070893
- Publication date Mar 21, 2013
- Canon Kabushiki Kaisha
- Chidane Ouchi
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IMAGING APPARATUS
- Publication number 20130034209
- Publication date Feb 7, 2013
- Canon Kabushiki Kaisha
- Chidane Ouchi
- G02 - OPTICS
Information Patent Application
X-RAY IMAGING APPARATUS AND WAVEFRONT MEASURING APPARATUS
- Publication number 20120281217
- Publication date Nov 8, 2012
- Canon Kabushiki Kaisha
- Chidane Ouchi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
X-RAY IMAGING APPARATUS
- Publication number 20120263274
- Publication date Oct 18, 2012
- Canon Kabushiki Kaisha
- Chidane Ouchi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
X-RAY IMAGING APPARATUS
- Publication number 20120236988
- Publication date Sep 20, 2012
- Canon Kabushiki Kaisha
- Toru Den
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
X-RAY IMAGING APPARATUS, X-RAY IMAGING METHOD, AND X-RAY IMAGING PR...
- Publication number 20110280368
- Publication date Nov 17, 2011
- Canon Kabushiki Kaisha
- Chidane Ouchi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
IMAGING APPARATUS AND IMAGING METHOD
- Publication number 20110200168
- Publication date Aug 18, 2011
- Canon Kabushiki Kaisha
- Chidane Ouchi
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IMAGING APPARATUS, X-RAY IMAGING METHOD, AND X-RAY IMAGING PR...
- Publication number 20100290590
- Publication date Nov 18, 2010
- Canon Kabushiki Kaisha
- Chidane Ouchi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
TALBOT INTERFEROMETER, ITS ADJUSTMENT METHOD, AND MEASUREMENT METHOD
- Publication number 20100271636
- Publication date Oct 28, 2010
- Canon Kabushiki Kaisha
- Toshiyuki Naoi
- G01 - MEASURING TESTING
Information Patent Application
ABSOLUTE POSITION MEASUREMENT APPARATUS AND METHOD
- Publication number 20100235137
- Publication date Sep 16, 2010
- Canon Kabushiki Kaisha
- Yuzo Seo
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS, EXPOSURE APPARATUS HAVING THE SAME, AND DEVI...
- Publication number 20100190115
- Publication date Jul 29, 2010
- Canon Kabushiki Kaisha
- Seima Kato
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
WAVEFRONT-ABERRATION-MEASURING DEVICE AND EXPOSURE APPARATUS
- Publication number 20100177323
- Publication date Jul 15, 2010
- Canon Kabushiki Kaisha
- Chidane Ouchi
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS, EXPOSURE APPARATUS AND METHOD, AND DEVICE MANU...
- Publication number 20090290136
- Publication date Nov 26, 2009
- Canon Kabushiki Kaisha
- Chidane Ouchi
- G01 - MEASURING TESTING
Information Patent Application
EXPOSURE APPARATUS AND DEVICE MANUFACTURING METHOD
- Publication number 20090268188
- Publication date Oct 29, 2009
- Canon Kabushiki Kaisha
- Seima Kato
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
WAVEFRONT ABERRATION MEASURING METHOD, MASK, WAVEFRONT ABERRATION M...
- Publication number 20090213389
- Publication date Aug 27, 2009
- Canon Kabushiki Kaisha
- Chidane Ouchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Measuring method and apparatus using shearing interferometry, expos...
- Publication number 20050117168
- Publication date Jun 2, 2005
- Canon Kabushiki Kaisha
- Chidane Ouchi
- G01 - MEASURING TESTING
Information Patent Application
Interference system and semiconductor exposure apparatus having the...
- Publication number 20040085548
- Publication date May 6, 2004
- Canon Kabushiki Kaisha
- Chidane Ouchi
- G01 - MEASURING TESTING
Information Patent Application
Projection exposure apparatus and device manufacturing method using...
- Publication number 20020131030
- Publication date Sep 19, 2002
- Chidane Ouchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Exposure apparatus and device manufacturing method using the same
- Publication number 20020101892
- Publication date Aug 1, 2002
- Chidane Ouchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Interference system and semiconductor exposure apparatus having the...
- Publication number 20020024005
- Publication date Feb 28, 2002
- Chidane Ouchi
- G01 - MEASURING TESTING
Information Patent Application
Measuring device and measuring method
- Publication number 20020024673
- Publication date Feb 28, 2002
- Chidane Ouchi
- G01 - MEASURING TESTING
Information Patent Application
EXPOSURE APPARATUS AND DEVICE MANUFACTURING METHOD USING THE SAME
- Publication number 20010046088
- Publication date Nov 29, 2001
- NAOTO SANO
- H01 - BASIC ELECTRIC ELEMENTS

Chidane Ouchi

Person

Patents Grantslast 30 patents

X-ray imaging apparatus and wavefront measuring apparatus

X-ray imaging apparatus

X-ray imaging apparatus

X-ray imaging apparatus

Absolute position measurement apparatus and method

X-ray imaging apparatus

Imaging apparatus and imaging method

X-ray imaging apparatus, X-ray imaging method, and X-ray imaging pr...

Talbot interferometer, its adjustment method, and measurement method

Wavefront-aberration-measuring device and exposure apparatus

X-ray imaging apparatus, X-ray imaging method, and X-ray imaging pr...

Wavefront aberration measuring method, mask, wavefront aberration m...

X-ray imaging apparatus, X-ray imaging method, and X-ray imaging pr...

Measuring apparatus, exposure apparatus and method, and device manu...

Measurement apparatus, exposure apparatus having the same, and devi...

Measuring method and apparatus using shearing interferometry, expos...

Measuring device and measuring method

Interference system and semiconductor exposure apparatus having the...

Projection exposure apparatus and device manufacturing method that...

Exposure apparatus and device manufacturing method using the same

Surface shape measuring apparatus and method

Interference system and semiconductor exposure apparatus having the...

Exposure apparatus and device manufacturing method using the same

Illuminance distribution measuring system

Patents Applicationslast 30 patents

X-RAY IMAGING APPARATUS

X-RAY TALBOT INTERFEROMETER AND X-RAY TALBOT IMAGING SYSTEM

X-RAY IMAGING APPARATUS

X-RAY IMAGING APPARATUS, X-RAY IMAGING METHOD, AND X-RAY IMAGING PR...

X-RAY IMAGING APPARATUS

X-RAY IMAGING APPARATUS AND WAVEFRONT MEASURING APPARATUS

X-RAY IMAGING APPARATUS

X-RAY IMAGING APPARATUS

X-RAY IMAGING APPARATUS, X-RAY IMAGING METHOD, AND X-RAY IMAGING PR...

IMAGING APPARATUS AND IMAGING METHOD

X-RAY IMAGING APPARATUS, X-RAY IMAGING METHOD, AND X-RAY IMAGING PR...

TALBOT INTERFEROMETER, ITS ADJUSTMENT METHOD, AND MEASUREMENT METHOD

ABSOLUTE POSITION MEASUREMENT APPARATUS AND METHOD

MEASUREMENT APPARATUS, EXPOSURE APPARATUS HAVING THE SAME, AND DEVI...

WAVEFRONT-ABERRATION-MEASURING DEVICE AND EXPOSURE APPARATUS

MEASURING APPARATUS, EXPOSURE APPARATUS AND METHOD, AND DEVICE MANU...

EXPOSURE APPARATUS AND DEVICE MANUFACTURING METHOD

WAVEFRONT ABERRATION MEASURING METHOD, MASK, WAVEFRONT ABERRATION M...

Measuring method and apparatus using shearing interferometry, expos...

Interference system and semiconductor exposure apparatus having the...

Projection exposure apparatus and device manufacturing method using...

Exposure apparatus and device manufacturing method using the same

Interference system and semiconductor exposure apparatus having the...

Measuring device and measuring method

EXPOSURE APPARATUS AND DEVICE MANUFACTURING METHOD USING THE SAME