Chie Ishikawa

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Surface defect inspecting method and device
- Patent number 7,599,050
- Issue date Oct 6, 2009
- Daihatsu Motor Co., Ltd.
- Chie Ishikawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Surface Defect Inspecting Method And Device
- Publication number 20070206182
- Publication date Sep 6, 2007
- DAIHATSU MOTOR CO., LTD.
- Chie Ishikawa
- G01 - MEASURING TESTING