Membership
Tour
Register
Log in
Chie Osawa
Follow
Person
Tokyo, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Detection chip, detection kit, detection system, and method for det...
Patent number
10,677,732
Issue date
Jun 9, 2020
Konica Minolta, Inc.
Chie Osawa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DETECTION CHIP, DETECTION KIT, DETECTION SYSTEM, AND METHOD FOR DET...
Publication number
20190003968
Publication date
Jan 3, 2019
KONICA MINOLTA INC
Chie Osawa
G01 - MEASURING TESTING