Chie YABUTANI

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Automated analyzer and automated analysis method
- Patent number 12,146,890
- Issue date Nov 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuto Kazama
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device and automatic analysis method
- Patent number 11,946,941
- Issue date Apr 2, 2024
- HITACHI HIGH-TECH CORPORATION
- Chie Yabutani
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device
- Patent number 11,808,671
- Issue date Nov 7, 2023
- HITACHI HIGH-TECH CORPORATION
- Sakuichiro Adachi
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Automatic analysis system
- Patent number 11,796,553
- Issue date Oct 24, 2023
- HITACHI HIGH-TECH CORPORATION
- Nobuhiko Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device
- Patent number 11,747,355
- Issue date Sep 5, 2023
- HITACHI HIGH-TECH CORPORATION
- Chie Yabutani
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device and automatic analysis method
- Patent number 11,231,432
- Issue date Jan 25, 2022
- HITACHI HIGH-TECH CORPORATION
- Hiroki Akase
- G01 - MEASURING TESTING
Information Patent Grant
Automated analyzer and automated analysis method
- Patent number 11,187,712
- Issue date Nov 30, 2021
- Hitachi High-Technologies Corporation
- Yuto Kazama
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device
- Patent number 11,156,625
- Issue date Oct 26, 2021
- HITACHI HIGH-TECH CORPORATION
- Chie Yabutani
- G01 - MEASURING TESTING
Information Patent Grant
Automated analysis device
- Patent number 10,989,708
- Issue date Apr 27, 2021
- HITACHI HIGH-TECH CORPORATION
- Chie Yabutani
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device and automatic analysis method
- Patent number 10,746,748
- Issue date Aug 18, 2020
- HITACHI HIGH-TECH CORPORATION
- Chie Yabutani
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device, automatic analysis system, and automatic...
- Patent number 10,725,028
- Issue date Jul 28, 2020
- HITACHI HIGH-TECH CORPORATION
- Toshiyuki Inabe
- G01 - MEASURING TESTING
Information Patent Grant
Automated analyzer
- Patent number 10,684,298
- Issue date Jun 16, 2020
- HITACHI HIGH-TECH CORPORATION
- Akihisa Makino
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Automatic analysis device
- Patent number 10,466,261
- Issue date Nov 5, 2019
- Hitachi High-Technologies Corporation
- Minoru Sano
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device
- Patent number 10,330,692
- Issue date Jun 25, 2019
- Hitachi High-Technologies Corporation
- Akihisa Makino
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device and analysis method
- Patent number 10,295,555
- Issue date May 21, 2019
- Hitachi High-Technologies Corporation
- Chie Yabutani
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis apparatus
- Patent number 10,267,817
- Issue date Apr 23, 2019
- Hitachi High-Technologies Corporation
- Tatsuya Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Method for stirring a mixed liquid in an automatic analyzer includi...
- Patent number 10,041,964
- Issue date Aug 7, 2018
- Hitachi High-Technologies Corporation
- Chie Yabutani
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Automatic coagulation analyzing apparatus and analyzing method
- Patent number 9,581,609
- Issue date Feb 28, 2017
- Hitachi High-Technologies Corporation
- Chie Yabutani
- G01 - MEASURING TESTING
Information Patent Grant
Automated analyzer and automated analysis method
- Patent number 9,494,525
- Issue date Nov 15, 2016
- Hitachi High-Technologies Corporation
- Shinji Tarumi
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
AUTONOMOUS ANALYSIS DEVICE, DATA PROCESSING DEVICE, DATA PROCESSING...
- Publication number 20240353436
- Publication date Oct 24, 2024
- HITACHI HIGH-TECH CORPORATION
- Mayuko GOTO
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
- Publication number 20240192234
- Publication date Jun 13, 2024
- HITACHI HIGH-TECH CORPORATION
- Chie YABUTANI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE
- Publication number 20230408537
- Publication date Dec 21, 2023
- HITACHI HIGH-TECH CORPORATION
- Chie YABUTANI
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION CURVE GENERATION METHOD, AUTONOMOUS ANALYSIS DEVICE, AN...
- Publication number 20230258669
- Publication date Aug 17, 2023
- HITACHI HIGH-TECH CORPORATION
- Kyoko YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE
- Publication number 20220003794
- Publication date Jan 6, 2022
- HITACHI HIGH-TECH CORPORATION
- Chie YABUTANI
- G01 - MEASURING TESTING
Information Patent Application
Automated Analyzer and Automated Analysis Method
- Publication number 20210405079
- Publication date Dec 30, 2021
- Hitachi High-Technologies Corporation
- Yuto Kazama
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS SYSTEM
- Publication number 20210293841
- Publication date Sep 23, 2021
- HITACHI HIGH-TECH CORPORATION
- Nobuhiko SASAKI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE
- Publication number 20210025911
- Publication date Jan 28, 2021
- HITACHI HIGH-TECH CORPORATION
- Sakuichiro ADACHI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
- Publication number 20200326353
- Publication date Oct 15, 2020
- HITACHI HIGH-TECH CORPORATION
- Chie YABUTANI
- G01 - MEASURING TESTING
Information Patent Application
Automated Analyzer and Automated Analysis Method
- Publication number 20200271677
- Publication date Aug 27, 2020
- Hitachi High-Technologies Corporation
- Yuto KAZAMA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE
- Publication number 20200241024
- Publication date Jul 30, 2020
- Hitachi High-Technologies Corporation
- Chie YABUTANI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
- Publication number 20190369131
- Publication date Dec 5, 2019
- Hitachi High-Technologies Corporation
- Hiroki AKASE
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED ANALYZER
- Publication number 20190339295
- Publication date Nov 7, 2019
- Hitachi High-Technologies Corporation
- Akihisa MAKINO
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED ANALYSIS DEVICE
- Publication number 20190041386
- Publication date Feb 7, 2019
- Hitachi High-Technologies Corporation
- Chie YABUTANI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE, AUTOMATIC ANALYSIS SYSTEM, AND AUTOMATIC...
- Publication number 20180231537
- Publication date Aug 16, 2018
- Hitachi High-Technologies Corporation
- Toshiyuki INABE
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
- Publication number 20180080948
- Publication date Mar 22, 2018
- Hitachi High-Technologies Corporation
- Chie YABUTANI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE
- Publication number 20170328925
- Publication date Nov 16, 2017
- Hitachi High-Technologies Corporation
- Minoru SANO
- G01 - MEASURING TESTING
Information Patent Application
Automatic Analysis Apparatus
- Publication number 20170212138
- Publication date Jul 27, 2017
- Hitachi High-Technologies Corporation
- Tatsuya SAKAI
- G01 - MEASURING TESTING
Information Patent Application
Automatic Analytical Apparatus
- Publication number 20170131306
- Publication date May 11, 2017
- Hitachi High-Technologies Corporation
- Shinji TARUMI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE
- Publication number 20160291048
- Publication date Oct 6, 2016
- Hitachi High-Technologies Corporation
- Akihisa MAKINO
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZING APPARATUS AND ANALYZING METHOD
- Publication number 20160291046
- Publication date Oct 6, 2016
- Hitachi High-Technologies Corporation
- Chie YABUTANI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20160274133
- Publication date Sep 22, 2016
- Hitachi High-Technologies Corporation
- Chie YABUTANI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20160209437
- Publication date Jul 21, 2016
- Hitachi High-Technologies Corporation
- Chie YABUTANI
- G01 - MEASURING TESTING
Information Patent Application
Automated Analyzer and Automated Analysis Method
- Publication number 20150316531
- Publication date Nov 5, 2015
- Hitachi High-Technologies Corporation
- Shinji TARUMI
- G01 - MEASURING TESTING

Chie YABUTANI

Person

Patents Grantslast 30 patents

Automated analyzer and automated analysis method

Automatic analysis device and automatic analysis method

Automatic analysis device

Automatic analysis system

Automatic analysis device

Automatic analysis device and automatic analysis method

Automated analyzer and automated analysis method

Automatic analysis device

Automated analysis device

Automatic analysis device and automatic analysis method

Automatic analysis device, automatic analysis system, and automatic...

Automated analyzer

Automatic analysis device

Automatic analysis device

Automatic analysis device and analysis method

Automatic analysis apparatus

Method for stirring a mixed liquid in an automatic analyzer includi...

Automatic coagulation analyzing apparatus and analyzing method

Automated analyzer and automated analysis method

Patents Applicationslast 30 patents

AUTONOMOUS ANALYSIS DEVICE, DATA PROCESSING DEVICE, DATA PROCESSING...

AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD

AUTOMATIC ANALYSIS DEVICE

CALIBRATION CURVE GENERATION METHOD, AUTONOMOUS ANALYSIS DEVICE, AN...

AUTOMATIC ANALYSIS DEVICE

Automated Analyzer and Automated Analysis Method

AUTOMATIC ANALYSIS SYSTEM

AUTOMATIC ANALYSIS DEVICE

AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD

Automated Analyzer and Automated Analysis Method

AUTOMATIC ANALYSIS DEVICE

AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD

AUTOMATED ANALYZER

AUTOMATED ANALYSIS DEVICE

AUTOMATIC ANALYSIS DEVICE, AUTOMATIC ANALYSIS SYSTEM, AND AUTOMATIC...

AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD

AUTOMATIC ANALYSIS DEVICE

Automatic Analysis Apparatus

Automatic Analytical Apparatus

AUTOMATIC ANALYSIS DEVICE

AUTOMATIC ANALYZING APPARATUS AND ANALYZING METHOD

AUTOMATIC ANALYSIS DEVICE AND ANALYSIS METHOD

AUTOMATIC ANALYZER

Automated Analyzer and Automated Analysis Method