TREA

Chie YABUTANI

Follow

Person

  • Tokyo, JP
People

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
    • Publication number 20240192234
    • Publication date Jun 13, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Chie YABUTANI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20230408537
    • Publication date Dec 21, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Chie YABUTANI
    • G01 - MEASURING TESTING
  • Information Patent Application

    CALIBRATION CURVE GENERATION METHOD, AUTONOMOUS ANALYSIS DEVICE, AN...
    • Publication number 20230258669
    • Publication date Aug 17, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Kyoko YAMAMOTO
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20220003794
    • Publication date Jan 6, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Chie YABUTANI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automated Analyzer and Automated Analysis Method
    • Publication number 20210405079
    • Publication date Dec 30, 2021
    • Hitachi High-Technologies Corporation
    • Yuto Kazama
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS SYSTEM
    • Publication number 20210293841
    • Publication date Sep 23, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Nobuhiko SASAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20210025911
    • Publication date Jan 28, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Sakuichiro ADACHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
    • Publication number 20200326353
    • Publication date Oct 15, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Chie YABUTANI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automated Analyzer and Automated Analysis Method
    • Publication number 20200271677
    • Publication date Aug 27, 2020
    • Hitachi High-Technologies Corporation
    • Yuto KAZAMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20200241024
    • Publication date Jul 30, 2020
    • Hitachi High-Technologies Corporation
    • Chie YABUTANI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
    • Publication number 20190369131
    • Publication date Dec 5, 2019
    • Hitachi High-Technologies Corporation
    • Hiroki AKASE
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20190339295
    • Publication date Nov 7, 2019
    • Hitachi High-Technologies Corporation
    • Akihisa MAKINO
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYSIS DEVICE
    • Publication number 20190041386
    • Publication date Feb 7, 2019
    • Hitachi High-Technologies Corporation
    • Chie YABUTANI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE, AUTOMATIC ANALYSIS SYSTEM, AND AUTOMATIC...
    • Publication number 20180231537
    • Publication date Aug 16, 2018
    • Hitachi High-Technologies Corporation
    • Toshiyuki INABE
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
    • Publication number 20180080948
    • Publication date Mar 22, 2018
    • Hitachi High-Technologies Corporation
    • Chie YABUTANI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20170328925
    • Publication date Nov 16, 2017
    • Hitachi High-Technologies Corporation
    • Minoru SANO
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analysis Apparatus
    • Publication number 20170212138
    • Publication date Jul 27, 2017
    • Hitachi High-Technologies Corporation
    • Tatsuya SAKAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analytical Apparatus
    • Publication number 20170131306
    • Publication date May 11, 2017
    • Hitachi High-Technologies Corporation
    • Shinji TARUMI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20160291048
    • Publication date Oct 6, 2016
    • Hitachi High-Technologies Corporation
    • Akihisa MAKINO
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZING APPARATUS AND ANALYZING METHOD
    • Publication number 20160291046
    • Publication date Oct 6, 2016
    • Hitachi High-Technologies Corporation
    • Chie YABUTANI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE AND ANALYSIS METHOD
    • Publication number 20160274133
    • Publication date Sep 22, 2016
    • Hitachi High-Technologies Corporation
    • Chie YABUTANI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20160209437
    • Publication date Jul 21, 2016
    • Hitachi High-Technologies Corporation
    • Chie YABUTANI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automated Analyzer and Automated Analysis Method
    • Publication number 20150316531
    • Publication date Nov 5, 2015
    • Hitachi High-Technologies Corporation
    • Shinji TARUMI
    • G01 - MEASURING TESTING