Chien-An CHEN

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Nanoimprint and etch fabrication of optical devices
- Patent number 12,092,956
- Issue date Sep 17, 2024
- Applied Materials, Inc.
- Jing Jiang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods and apparatus of processing transparent substrates
- Patent number 12,060,297
- Issue date Aug 13, 2024
- Applied Materials, Inc.
- Yongan Xu
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Grant
Apertures for flat optical devices
- Patent number 12,044,821
- Issue date Jul 23, 2024
- Applied Materials, Inc.
- Sage Toko Garrett Doshay
- G02 - OPTICS
Information Patent Grant
Method and system for organizing programmable semiconductor device...
- Patent number 12,038,781
- Issue date Jul 16, 2024
- Gowin Semiconductor Corporation
- Jianhua Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Photoresist loading solutions for flat optics fabrication
- Patent number 11,681,083
- Issue date Jun 20, 2023
- Applied Materials, Inc.
- Sage Toko Garrett Doshay
- G02 - OPTICS
Information Patent Grant
Patterning of multi-depth optical devices
- Patent number 11,614,685
- Issue date Mar 28, 2023
- Applied Materials, Inc.
- Ludovic Godet
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods and apparatus for organizing a programmable semiconductor d...
- Patent number 11,614,770
- Issue date Mar 28, 2023
- Gowin Semiconductor Corporation
- Jianhua Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of thin film deposition in trenches
- Patent number 11,572,619
- Issue date Feb 7, 2023
- Applied Materials, Inc.
- Jinrui Guo
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Electron beam apparatus for optical device fabrication
- Patent number 11,462,386
- Issue date Oct 4, 2022
- Applied Materials, Inc.
- Kartik Ramaswamy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods of optical device fabrication using an electron beam apparatus
- Patent number 11,430,634
- Issue date Aug 30, 2022
- Applied Materials, Inc.
- Ludovic Godet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Patterning of multi-depth optical devices
- Patent number 11,226,556
- Issue date Jan 18, 2022
- Applied Materials, Inc.
- Ludovic Godet
- G02 - OPTICS
Information Patent Grant
Methods and apparatus for providing a clock fabric for an FPGA orga...
- Patent number 11,216,022
- Issue date Jan 4, 2022
- Gowin Semiconductor Corporation
- Jianhua Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus of processing transparent substrates
- Patent number 11,111,176
- Issue date Sep 7, 2021
- Applied Materials, Inc.
- Yongan Xu
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Grant
Method and system for providing a configurable logic device having...
- Patent number 11,043,950
- Issue date Jun 22, 2021
- Gowin Semiconductor Corporation
- Jianhua Liu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Methods of optical device fabrication using an electron beam apparatus
- Patent number 10,818,472
- Issue date Oct 27, 2020
- Applied Materials, Inc.
- Ludovic Godet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for defect classification
- Patent number 10,482,590
- Issue date Nov 19, 2019
- KLA-Tencor Corporation
- Li He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for defect classification
- Patent number 9,898,811
- Issue date Feb 20, 2018
- KLA-Tencor Corporation
- Li He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Decision tree construction for automatic classification of defects...
- Patent number 9,489,599
- Issue date Nov 8, 2016
- KLA-Tencor Corp.
- Chien-Huei (Adam) Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Contour-based array inspection of patterned defects
- Patent number 9,483,819
- Issue date Nov 1, 2016
- KLA-Tencor Corporation
- Chien-Huei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data perturbation for wafer inspection or metrology setup using a m...
- Patent number 9,360,863
- Issue date Jun 7, 2016
- KLA-Tencor Corp.
- Govind Thattaisundaram
- G05 - CONTROLLING REGULATING
Information Patent Grant
Inspection recipe setup from reference image variation
- Patent number 9,262,821
- Issue date Feb 16, 2016
- KLA-Tencor Corp.
- Eugene Shifrin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Design-based inspection using repeating structures
- Patent number 9,170,211
- Issue date Oct 27, 2015
- KLA-Tencor Corp.
- Ashok V. Kulkarni
- G01 - MEASURING TESTING
Information Patent Grant
Automated inspection scenario generation
- Patent number 9,053,390
- Issue date Jun 9, 2015
- KLA-Tencor Corporation
- Mohan Mahadevan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Current mode logic circuits with automatic sink current adjustment
- Patent number 8,847,628
- Issue date Sep 30, 2014
- Integrated Device Technology Inc.
- Minhui Yan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Microelectromechanical-based oscillators having adjustable gain amp...
- Patent number 8,803,622
- Issue date Aug 12, 2014
- Integrated Device Technology, Inc.
- Minhui Yan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Dynamic care areas
- Patent number 8,781,781
- Issue date Jul 15, 2014
- KLA-Tencor Corp.
- Ashok V. Kulkarni
- G05 - CONTROLLING REGULATING
Information Patent Grant
In-system margin measurement circuit
- Patent number 8,686,773
- Issue date Apr 1, 2014
- Lattice Semiconductor Corporation
- Fulong Zhang
- G11 - INFORMATION STORAGE
Information Patent Grant
Contour-based defect detection using an inspection apparatus
- Patent number 8,669,523
- Issue date Mar 11, 2014
- KLA-Tencor Corporation
- Chien-Huei Chen
- G01 - MEASURING TESTING
Information Patent Grant
Missing code redistribution in pipeline analog to digital converter
- Patent number 8,648,913
- Issue date Feb 11, 2014
- OmniVision Technologies, Inc.
- Liping Deng
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor device property extraction, generation, visualization...
- Patent number 8,611,639
- Issue date Dec 17, 2013
- KLA-Tencor Technologies Corp.
- Ashok Kulkarni
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND APPARATUS FOR ORGANIZING A PROGRAMMABLE SEMICONDUCTOR D...
- Publication number 20240319762
- Publication date Sep 26, 2024
- GOWIN Semiconductor Corporation
- Jianhua Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRANSITION METAL DICHALCOGENIDE COATED FLAT OPTICAL DEVICES HAVING...
- Publication number 20240111075
- Publication date Apr 4, 2024
- Applied Materials, Inc.
- Russell Chin Yee TEO
- G02 - OPTICS
Information Patent Application
PHOTORESIST LOADING SOLUTIONS FOR FLAT OPTICS FABRICATION
- Publication number 20230280511
- Publication date Sep 7, 2023
- Applied Materials, Inc.
- Sage Toko Garrett DOSHAY
- G02 - OPTICS
Information Patent Application
Method and System for Organizing Programmable Semiconductor Device...
- Publication number 20230205255
- Publication date Jun 29, 2023
- Gowin Semiconductor Corporation
- Jianhua Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF THIN FILM DEPOSITION IN TRENCHES
- Publication number 20230151479
- Publication date May 18, 2023
- Applied Materials, Inc.
- Jinrui GUO
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
NANOIMPRINT AND ETCH FABRICATION OF OPTICAL DEVICES
- Publication number 20220326611
- Publication date Oct 13, 2022
- Applied Materials, Inc.
- Jing JIANG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PATTERNING OF MULTI-DEPTH OPTICAL DEVICES
- Publication number 20220100084
- Publication date Mar 31, 2022
- Applied Materials, Inc.
- Ludovic GODET
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS AND APPARATUS FOR ORGANIZING A PROGRAMMABLE SEMICONDUCTOR D...
- Publication number 20220083094
- Publication date Mar 17, 2022
- Gowin Semiconductor Corporation
- Jianhua Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND APPARATUS OF PROCESSING TRANSPARENT SUBSTRATES
- Publication number 20210395139
- Publication date Dec 23, 2021
- Applied Materials, Inc.
- Yongan XU
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Application
METHODS AND APPARATUS OF PROCESSING TRANSPARENT SUBSTRATES
- Publication number 20210269355
- Publication date Sep 2, 2021
- Applied Materials, Inc.
- Yongan XU
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Application
Method and System for Providing a Configurable Logic Device Having...
- Publication number 20210099175
- Publication date Apr 1, 2021
- GOWIN Semiconductor Corporation
- Jianhua Liu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHODS OF OPTICAL DEVICE FABRICATION USING AN ELECTRON BEAM APPARATUS
- Publication number 20210066036
- Publication date Mar 4, 2021
- Applied Materials, Inc.
- Ludovic GODET
- G02 - OPTICS
Information Patent Application
APERTURES FOR FLAT OPTICAL DEVICES
- Publication number 20200386911
- Publication date Dec 10, 2020
- Applied Materials, Inc.
- Sage Toko Garrett DOSHAY
- G02 - OPTICS
Information Patent Application
PHOTORESIST LOADING SOLUTIONS FOR FLAT OPTICS FABRICATION
- Publication number 20200386926
- Publication date Dec 10, 2020
- Applied Materials, Inc.
- Sage Toko Garrett DOSHAY
- G02 - OPTICS
Information Patent Application
MEHTOD OF THIN FILM DEPOSITION IN TRENCHES
- Publication number 20200332414
- Publication date Oct 22, 2020
- Applied Materials, Inc.
- Jinrui GUO
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
PATTERNING OF MULTI-DEPTH OPTICAL DEVICES
- Publication number 20200326621
- Publication date Oct 15, 2020
- Applied Materials, Inc.
- Ludovic GODET
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS OF OPTICAL DEVICE FABRICATION USING AN ELECTRON BEAM APPARATUS
- Publication number 20200194218
- Publication date Jun 18, 2020
- Applied Materials, Inc.
- Ludovic GODET
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRON BEAM APPARATUS FOR OPTICAL DEVICE FABRICATION
- Publication number 20200192027
- Publication date Jun 18, 2020
- Applied Materials, Inc.
- Kartik RAMASWAMY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and System for Defect Classification
- Publication number 20180114310
- Publication date Apr 26, 2018
- KLA-Tencor Corporation
- Li He
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LOW TEMP SINGLE PRECURSOR ARC HARD MASK FOR MULTILAYER PATTERNING A...
- Publication number 20170125241
- Publication date May 4, 2017
- Applied Materials, Inc.
- Shaunak MUKHERJEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspection Recipe Setup from Reference Image Variation
- Publication number 20150324964
- Publication date Nov 12, 2015
- KLA-Tencor Corporation
- Eugene Shifrin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Decision Tree Construction for Automatic Classification of Defects...
- Publication number 20150125064
- Publication date May 7, 2015
- KLA-Tencor Corporation
- Chien-Huei (Adam) Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTOUR-BASED ARRAY INSPECTION OF PATTERNED DEFECTS
- Publication number 20140212024
- Publication date Jul 31, 2014
- KLA-Tencor Corporation
- Chien-Huei CHEN
- G01 - MEASURING TESTING
Information Patent Application
Automated Inspection Scenario Generation
- Publication number 20140050389
- Publication date Feb 20, 2014
- KLA-Tencor Corporation
- Mohan Mahadevan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND APPARATUS FOR CLASSIFICATION OF DEFECTS USING SURFACE H...
- Publication number 20130082174
- Publication date Apr 4, 2013
- Chien-Huei CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTOUR-BASED DEFECT DETECTION USING AN INSPECTION APPARATUS
- Publication number 20120298862
- Publication date Nov 29, 2012
- Chien-Huei CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MISSING CODE REDISTRIBUTION IN PIPELINE ANALOG TO DIGITAL CONVERTER
- Publication number 20120262614
- Publication date Oct 18, 2012
- OMNIVISION TECHNOLOGIES, INC.
- Liping Deng
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Design-Based Inspection Using Repeating Structures
- Publication number 20120243773
- Publication date Sep 27, 2012
- KLA-Tencor Corporation
- Ashok V. Kulkarni
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHODS FOR REAL-TIME THREE-DIMENSIONAL SEM IMAGING A...
- Publication number 20120223227
- Publication date Sep 6, 2012
- Chien-Huei CHEN
- G01 - MEASURING TESTING
Information Patent Application
Data Perturbation for Wafer Inspection or Metrology Setup
- Publication number 20120116733
- Publication date May 10, 2012
- KLA-Tencor Corporation
- Govind Thattaisundaram
- G05 - CONTROLLING REGULATING

Chien-An CHEN

Person

Patents Grantslast 30 patents

Nanoimprint and etch fabrication of optical devices

Methods and apparatus of processing transparent substrates

Apertures for flat optical devices

Method and system for organizing programmable semiconductor device...

Photoresist loading solutions for flat optics fabrication

Patterning of multi-depth optical devices

Methods and apparatus for organizing a programmable semiconductor d...

Method of thin film deposition in trenches

Electron beam apparatus for optical device fabrication

Methods of optical device fabrication using an electron beam apparatus

Patterning of multi-depth optical devices

Methods and apparatus for providing a clock fabric for an FPGA orga...

Methods and apparatus of processing transparent substrates

Method and system for providing a configurable logic device having...

Methods of optical device fabrication using an electron beam apparatus

Method and system for defect classification

Method and system for defect classification

Decision tree construction for automatic classification of defects...

Contour-based array inspection of patterned defects

Data perturbation for wafer inspection or metrology setup using a m...

Inspection recipe setup from reference image variation

Design-based inspection using repeating structures

Automated inspection scenario generation

Current mode logic circuits with automatic sink current adjustment

Microelectromechanical-based oscillators having adjustable gain amp...

Dynamic care areas

In-system margin measurement circuit

Contour-based defect detection using an inspection apparatus

Missing code redistribution in pipeline analog to digital converter

Semiconductor device property extraction, generation, visualization...

Patents Applicationslast 30 patents

METHODS AND APPARATUS FOR ORGANIZING A PROGRAMMABLE SEMICONDUCTOR D...

TRANSITION METAL DICHALCOGENIDE COATED FLAT OPTICAL DEVICES HAVING...

PHOTORESIST LOADING SOLUTIONS FOR FLAT OPTICS FABRICATION

Method and System for Organizing Programmable Semiconductor Device...

METHOD OF THIN FILM DEPOSITION IN TRENCHES

NANOIMPRINT AND ETCH FABRICATION OF OPTICAL DEVICES

PATTERNING OF MULTI-DEPTH OPTICAL DEVICES

METHODS AND APPARATUS FOR ORGANIZING A PROGRAMMABLE SEMICONDUCTOR D...

METHODS AND APPARATUS OF PROCESSING TRANSPARENT SUBSTRATES

METHODS AND APPARATUS OF PROCESSING TRANSPARENT SUBSTRATES

Method and System for Providing a Configurable Logic Device Having...

METHODS OF OPTICAL DEVICE FABRICATION USING AN ELECTRON BEAM APPARATUS

APERTURES FOR FLAT OPTICAL DEVICES

PHOTORESIST LOADING SOLUTIONS FOR FLAT OPTICS FABRICATION

MEHTOD OF THIN FILM DEPOSITION IN TRENCHES

PATTERNING OF MULTI-DEPTH OPTICAL DEVICES

METHODS OF OPTICAL DEVICE FABRICATION USING AN ELECTRON BEAM APPARATUS

ELECTRON BEAM APPARATUS FOR OPTICAL DEVICE FABRICATION

Method and System for Defect Classification

LOW TEMP SINGLE PRECURSOR ARC HARD MASK FOR MULTILAYER PATTERNING A...

Inspection Recipe Setup from Reference Image Variation

Decision Tree Construction for Automatic Classification of Defects...

CONTOUR-BASED ARRAY INSPECTION OF PATTERNED DEFECTS

Automated Inspection Scenario Generation

METHODS AND APPARATUS FOR CLASSIFICATION OF DEFECTS USING SURFACE H...

CONTOUR-BASED DEFECT DETECTION USING AN INSPECTION APPARATUS

MISSING CODE REDISTRIBUTION IN PIPELINE ANALOG TO DIGITAL CONVERTER

Design-Based Inspection Using Repeating Structures

APPARATUS AND METHODS FOR REAL-TIME THREE-DIMENSIONAL SEM IMAGING A...

Data Perturbation for Wafer Inspection or Metrology Setup