Chien-Chih Liao

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Miao-Li City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Method of test probe alignment control
- Patent number 10,161,965
- Issue date Dec 25, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jui-Long Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of test probe alignment control
- Patent number 9,000,798
- Issue date Apr 7, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jui-Long Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of Test Probe Alignment Control
- Publication number 20150192616
- Publication date Jul 9, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jui-Long Chen
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF TEST PROBE ALIGNMENT CONTROL
- Publication number 20130335109
- Publication date Dec 19, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jui-Long Chen
- G01 - MEASURING TESTING