Chien-Ho Lin

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Hsinchu Hsiang, TW

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Patents Grantslast 30 patents

Information Patent Grant
Probe for high frequency signal transmission
- Patent number 8,106,673
- Issue date Jan 31, 2012
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Probe for high frequency signal transmission and probe card using t...
- Patent number 7,791,359
- Issue date Sep 7, 2010
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MICROELECTROMECHANICAL PROBE AND PROBE HEAD HAVING THE SAME
- Publication number 20180267083
- Publication date Sep 20, 2018
- MPI Corporation
- Shao-Lun WEI
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR HIGH FREQUENCY SIGNAL TRANSMISSION
- Publication number 20100253378
- Publication date Oct 7, 2010
- MPI CORPORATION
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR HIGH FREQUENCY SIGNAL TRANSMISSION AND PROBE CARD USING T...
- Publication number 20080164900
- Publication date Jul 10, 2008
- MJC Probe Incorporation No.
- Wei-Cheng KU
- G01 - MEASURING TESTING