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Chien-Huei Huang
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Hsinchu Hsiang, TW
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last 30 patents
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Patent Grant
Probing device
Patent number
7,782,070
Issue date
Aug 24, 2010
MJC Probe Incorporated
Wei-Cheng Ku
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
PROBING DEVICE
Publication number
20090009198
Publication date
Jan 8, 2009
MJC Probe Incorporation
Wei-Cheng Ku
G01 - MEASURING TESTING