Chien-Kai Wang

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Providence, RI, US

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Patents Grantslast 30 patents

Information Patent Grant
Device and method for measuring distribution of atomic resolution d...
- Patent number 9,003,561
- Issue date Apr 7, 2015
- Korea Institute of Machinery & Materials
- Bong Kyun Jang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE AND METHOD FOR MEASURING DISTRIBUTION OF ATOMIC RESOLUTION D...
- Publication number 20150121575
- Publication date Apr 30, 2015
- Korea Institute of Machinery and Materials
- Bong Kyun JANG
- G01 - MEASURING TESTING