Chiew Khiang Kuit

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Penang, MY

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for using programmable logic circuitry to test...
- Patent number 9,874,607
- Issue date Jan 23, 2018
- Altera Corporation
- Chiew Khiang Kuit
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit with configurable test pins
- Patent number 8,327,199
- Issue date Dec 4, 2012
- Altera Corporation
- Jayabrata Ghosh Dastidar
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Techniques For Testing Leakage Current In Input And Output Circuits
- Publication number 20240402245
- Publication date Dec 5, 2024
- Altera Corporation
- Chiew Khiang Kuit
- G01 - MEASURING TESTING