Chih-Chiang Tseng

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Dublin, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Multilayered probe card
- Patent number 7,948,252
- Issue date May 24, 2011
- FormFactor, Inc.
- Gary W. Grube
- G01 - MEASURING TESTING
Information Patent Grant
Composite wiring structure having a wiring block and an insulating...
- Patent number 7,400,157
- Issue date Jul 15, 2008
- FormFactor, Inc.
- Gary W. Grube
- G01 - MEASURING TESTING
Information Patent Grant
High performance probe system
- Patent number 6,911,835
- Issue date Jun 28, 2005
- FormFactor, Inc.
- Matthew Chraft
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing a probe card
- Patent number 6,864,105
- Issue date Mar 8, 2005
- FormFactor, Inc.
- Gary W. Grube
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF MANUFACTURING A PROBE CARD
- Publication number 20080272794
- Publication date Nov 6, 2008
- FormFactor, Inc.
- Gary W. Grube
- G01 - MEASURING TESTING
Information Patent Application
Method of Manufacturing a Probe Card
- Publication number 20070247176
- Publication date Oct 25, 2007
- FormFactor, Inc.
- Gary W. Grube
- G01 - MEASURING TESTING
Information Patent Application
Method of manufacturing a probe card
- Publication number 20050146339
- Publication date Jul 7, 2005
- FormFactor, Inc.
- Gary W. Grube
- G01 - MEASURING TESTING
Information Patent Application
High performance probe system
- Publication number 20040046579
- Publication date Mar 11, 2004
- FormFactor, Inc.
- Matthew Chraft
- G01 - MEASURING TESTING
Information Patent Application
Method of manufacturing a probe card
- Publication number 20030025172
- Publication date Feb 6, 2003
- FormFactor, Inc.
- Gary W. Grube
- G01 - MEASURING TESTING