CHIH-CHIEH KANG

Person

Tainan City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and method for fabricating the same
- Patent number 12,261,169
- Issue date Mar 25, 2025
- United Microelectronics Corp.
- Kuo-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetoresistive random access memory
- Patent number 12,200,947
- Issue date Jan 14, 2025
- United Microelectronics Corp.
- Ting-Hsiang Huang
Information Patent Grant
Bit cell structure for one-time-programming
- Patent number 12,133,377
- Issue date Oct 29, 2024
- United Microelectronics Corp.
- Kuo-Hsing Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetoresistive random access memory
- Patent number 11,895,847
- Issue date Feb 6, 2024
- United Microelectronics Corp.
- Ting-Hsiang Huang
Information Patent Grant
High electron mobility transistor (HEMT) and forming method thereof
- Patent number 11,705,512
- Issue date Jul 18, 2023
- United Microelectronics Corp.
- Kuo-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High electron mobility transistor (HEMT) and forming method thereof
- Patent number 11,631,761
- Issue date Apr 18, 2023
- United Microelectronics Corp.
- Kuo-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3D semiconductor structure and method of fabricating the same
- Patent number 11,605,631
- Issue date Mar 14, 2023
- United Microelectronics Corp.
- Yung-Chen Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetoresistive random access memory
- Patent number 11,532,666
- Issue date Dec 20, 2022
- United Microelectronics Corp.
- Ting-Hsiang Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming fin forced stack inverter
- Patent number 11,316,031
- Issue date Apr 26, 2022
- United Microelectronics Corp.
- Kuo-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High electron mobility transistor (HEMT) and forming method thereof
- Patent number 11,296,214
- Issue date Apr 5, 2022
- United Microelectronics Corp.
- Kuo-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mark pattern in semiconductor device
- Patent number 11,296,036
- Issue date Apr 5, 2022
- United Microelectronics Corp.
- Chih-Kai Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3D semiconductor structure and method of fabricating the same
- Patent number 11,195,831
- Issue date Dec 7, 2021
- United Microelectronics Corp.
- Yung-Chen Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetoresistive random access memory
- Patent number 10,991,757
- Issue date Apr 27, 2021
- United Microelectronics Corp.
- Ting-Hsiang Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 10,777,508
- Issue date Sep 15, 2020
- United Microelectronics Corp.
- Chih-Kai Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetoresistive random access memory wherein number of memory cell...
- Patent number 10,700,126
- Issue date Jun 30, 2020
- United Microelectronics Corp.
- Ting-Hsiang Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for fabricating the same
- Patent number 10,692,928
- Issue date Jun 23, 2020
- United Microelectronics Corp.
- Ting-Hsiang Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
1-1 fin forced stack inverter
- Patent number 10,580,883
- Issue date Mar 3, 2020
- United Microelectronics Corp.
- Kuo-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Intra-metal capacitor and method of forming the same
- Patent number 10,529,707
- Issue date Jan 7, 2020
- United Microelectronics Corp.
- Hsin-Hsien Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating single diffusion break structure directly un...
- Patent number 10,256,155
- Issue date Apr 9, 2019
- United Microelectronics Corp.
- Wen-Kai Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test key structure and method of measuring resistance of vias
- Patent number 10,247,774
- Issue date Apr 2, 2019
- United Microelectronics Corp.
- Hsin-Hsien Chen
- G01 - MEASURING TESTING
Information Patent Grant
Intra-metal capacitor and method of forming the same
- Patent number 10,002,864
- Issue date Jun 19, 2018
- United Microelectronics Corp.
- Hsin-Hsien Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Illumination apparatus
- Patent number 9,371,976
- Issue date Jun 21, 2016
- Southern Taiwan University of Science and Technology
- Chih-Chieh Kang
- F21 - LIGHTING
Information Patent Grant
Resistor and fabrication method thereof
- Patent number 9,147,678
- Issue date Sep 29, 2015
- United Microelectronics Corp.
- Chih-Kai Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Illumination apparatus
- Patent number 9,068,716
- Issue date Jun 30, 2015
- Southern Taiwan University of Science and Technology
- Chih-Chieh Kang
- F21 - LIGHTING
Information Patent Grant
Test key structure and method for measuring step height by such tes...
- Patent number 8,890,551
- Issue date Nov 18, 2014
- United Microelectronics Corp.
- Chih-Kai Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
LED illumination structure without light guide plate
- Patent number 8,545,048
- Issue date Oct 1, 2013
- Southern Taiwan University
- Chih-Chieh Kang
- F21 - LIGHTING
Information Patent Grant
Radiation structure without light guiding board
- Patent number 8,382,324
- Issue date Feb 26, 2013
- Southern Taiwan University
- Chih-Chieh Kang
- G02 - OPTICS
Information Patent Grant
Polygonal radiation module having radiating members without light g...
- Patent number 7,891,840
- Issue date Feb 22, 2011
- Southern Taiwan University
- Chih-Chieh Kang
- F21 - LIGHTING

Patents Applicationslast 30 patents

Information Patent Application
Capacitor structure with fin structure and manufacturing method the...
- Publication number 20250142849
- Publication date May 1, 2025
- UNITED MICROELECTRONICS CORP.
- Hsin-Hsien Chen
Information Patent Application
MAGNETORESISTIVE RANDOM ACCESS MEMORY
- Publication number 20250107101
- Publication date Mar 27, 2025
- UNITED MICROELECTRONICS CORP.
- Ting-Hsiang Huang
Information Patent Application
SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF
- Publication number 20250089281
- Publication date Mar 13, 2025
- United Microelectronics Corp.
- Wen-Kai Lin
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
- Publication number 20250071983
- Publication date Feb 27, 2025
- UNITED MICROELECTRONICS CORP.
- Kuo-Hsing Lee
Information Patent Application
BIT CELL STRUCTURE FOR ONE-TIME-PROGRAMMING
- Publication number 20250014661
- Publication date Jan 9, 2025
- UNITED MICROELECTRONICS CORP.
- Kuo-Hsing Lee
- G11 - INFORMATION STORAGE
Information Patent Application
STATIC RANDOM ACCESS MEMORY
- Publication number 20240397689
- Publication date Nov 28, 2024
- United Microelectronics Corp.
- Hsin-Hsien Chen
Information Patent Application
SEMICONDUCTOR DEVICE AND FABRICATING METHOD OF THE SAME
- Publication number 20240387523
- Publication date Nov 21, 2024
- UNITED MICROELECTRONICS CORP.
- Hsin-Hsien Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
- Publication number 20240153812
- Publication date May 9, 2024
- UNITED MICROELECTRONICS CORP.
- Wen-Kai Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETORESISTIVE RANDOM ACCESS MEMORY
- Publication number 20240130140
- Publication date Apr 18, 2024
- UNITED MICROELECTRONICS CORP.
- Ting-Hsiang Huang
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
- Publication number 20230422491
- Publication date Dec 28, 2023
- UNITED MICROELECTRONICS CORP.
- Yung-Chen Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
- Publication number 20230380148
- Publication date Nov 23, 2023
- UNITED MICROELECTRONICS CORP.
- Kuo-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
- Publication number 20230317715
- Publication date Oct 5, 2023
- UNITED MICROELECTRONICS CORP.
- Kuo-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETORESISTIVE RANDOM ACCESS MEMORY
- Publication number 20230071086
- Publication date Mar 9, 2023
- UNITED MICROELECTRONICS CORP.
- Ting-Hsiang Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BIT CELL STRUCTURE FOR ONE-TIME-PROGRAMMING
- Publication number 20220328504
- Publication date Oct 13, 2022
- UNITED MICROELECTRONICS CORP.
- Kuo-Hsing Lee
- G11 - INFORMATION STORAGE
Information Patent Application
HIGH ELECTRON MOBILITY TRANSISTOR (HEMT) AND FORMING METHOD THEREOF
- Publication number 20220181478
- Publication date Jun 9, 2022
- UNITED MICROELECTRONICS CORP.
- Kuo-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH ELECTRON MOBILITY TRANSISTOR (HEMT) AND FORMING METHOD THEREOF
- Publication number 20220173236
- Publication date Jun 2, 2022
- UNITED MICROELECTRONICS CORP.
- Kuo-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
3D SEMICONDUCTOR STRUCTURE AND METHOD OF FABRICATING THE SAME
- Publication number 20220059528
- Publication date Feb 24, 2022
- UNITED MICROELECTRONICS CORP.
- Yung-Chen Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETORESISTIVE RANDOM ACCESS MEMORY
- Publication number 20210210550
- Publication date Jul 8, 2021
- UNITED MICROELECTRONICS CORP.
- Ting-Hsiang Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
3D SEMICONDUCTOR STRUCTURE AND METHOD OF FABRICATING THE SAME
- Publication number 20210082911
- Publication date Mar 18, 2021
- UNITED MICROELECTRONICS CORP.
- Yung-Chen Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH ELECTRON MOBILITY TRANSISTOR (HEMT) AND FORMING METHOD THEREOF
- Publication number 20210020769
- Publication date Jan 21, 2021
- UNITED MICROELECTRONICS CORP.
- Kuo-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MARK PATTERN IN SEMICONDUCTOR DEVICE
- Publication number 20200365521
- Publication date Nov 19, 2020
- UNITED MICROELECTRONICS CORP.
- Chih-Kai Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETORESISTIVE RANDOM ACCESS MEMORY
- Publication number 20200357850
- Publication date Nov 12, 2020
- UNITED MICROELECTRONICS CORP.
- Ting-Hsiang Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
- Publication number 20200203425
- Publication date Jun 25, 2020
- UNITED MICROELECTRONICS CORP.
- Ting-Hsiang Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING FIN FORCED STACK INVERTER
- Publication number 20200152768
- Publication date May 14, 2020
- UNITED MICROELECTRONICS CORP.
- Kuo-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETORESISTIVE RANDOM ACESS MEMORY WHEREIN NUMBER OF MEMORY CELLS...
- Publication number 20200091229
- Publication date Mar 19, 2020
- UNITED MICROELECTRONICS CORP.
- Ting-Hsiang Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
1-1 FIN FORCED STACK INVERTER AND METHOD OF FORMING FIN FORCED STAC...
- Publication number 20190252518
- Publication date Aug 15, 2019
- UNITED MICROELECTRONICS CORP.
- Kuo-Hsing Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTRA-METAL CAPACITOR AND METHOD OF FORMING THE SAME
- Publication number 20180269201
- Publication date Sep 20, 2018
- UNITED MICROELECTRONICS CORP.
- Hsin-Hsien Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST KEY STRUCTURE AND METHOD OF MEASURING RESISTANCE OF VIAS
- Publication number 20180156862
- Publication date Jun 7, 2018
- UNITED MICROELECTRONICS CORP.
- Hsin-Hsien Chen
- G01 - MEASURING TESTING
Information Patent Application
INTRA-METAL CAPACITOR AND METHOD OF FORMING THE SAME
- Publication number 20180151555
- Publication date May 31, 2018
- UNITED MICROELECTRONICS CORP.
- Hsin-Hsien Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20180130753
- Publication date May 10, 2018
- UNITED MICROELECTRONICS CORP.
- Chih-Kai Kang
- H01 - BASIC ELECTRIC ELEMENTS

CHIH-CHIEH KANG

Person

Patents Grantslast 30 patents

Semiconductor device and method for fabricating the same

Magnetoresistive random access memory

Bit cell structure for one-time-programming

Magnetoresistive random access memory

High electron mobility transistor (HEMT) and forming method thereof

High electron mobility transistor (HEMT) and forming method thereof

3D semiconductor structure and method of fabricating the same

Magnetoresistive random access memory

Method of forming fin forced stack inverter

High electron mobility transistor (HEMT) and forming method thereof

Mark pattern in semiconductor device

3D semiconductor structure and method of fabricating the same

Magnetoresistive random access memory

Semiconductor device

Magnetoresistive random access memory wherein number of memory cell...

Semiconductor device and method for fabricating the same

1-1 fin forced stack inverter

Intra-metal capacitor and method of forming the same

Method for fabricating single diffusion break structure directly un...

Test key structure and method of measuring resistance of vias

Intra-metal capacitor and method of forming the same

Illumination apparatus

Resistor and fabrication method thereof

Illumination apparatus

Test key structure and method for measuring step height by such tes...

LED illumination structure without light guide plate

Radiation structure without light guiding board

Polygonal radiation module having radiating members without light g...

Patents Applicationslast 30 patents

Capacitor structure with fin structure and manufacturing method the...

MAGNETORESISTIVE RANDOM ACCESS MEMORY

SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF

SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

BIT CELL STRUCTURE FOR ONE-TIME-PROGRAMMING

STATIC RANDOM ACCESS MEMORY

SEMICONDUCTOR DEVICE AND FABRICATING METHOD OF THE SAME

SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

MAGNETORESISTIVE RANDOM ACCESS MEMORY

SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

MAGNETORESISTIVE RANDOM ACCESS MEMORY

BIT CELL STRUCTURE FOR ONE-TIME-PROGRAMMING

HIGH ELECTRON MOBILITY TRANSISTOR (HEMT) AND FORMING METHOD THEREOF

HIGH ELECTRON MOBILITY TRANSISTOR (HEMT) AND FORMING METHOD THEREOF

3D SEMICONDUCTOR STRUCTURE AND METHOD OF FABRICATING THE SAME

MAGNETORESISTIVE RANDOM ACCESS MEMORY

3D SEMICONDUCTOR STRUCTURE AND METHOD OF FABRICATING THE SAME

HIGH ELECTRON MOBILITY TRANSISTOR (HEMT) AND FORMING METHOD THEREOF

MARK PATTERN IN SEMICONDUCTOR DEVICE

MAGNETORESISTIVE RANDOM ACCESS MEMORY

SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

METHOD OF FORMING FIN FORCED STACK INVERTER

MAGNETORESISTIVE RANDOM ACESS MEMORY WHEREIN NUMBER OF MEMORY CELLS...

1-1 FIN FORCED STACK INVERTER AND METHOD OF FORMING FIN FORCED STAC...

INTRA-METAL CAPACITOR AND METHOD OF FORMING THE SAME

TEST KEY STRUCTURE AND METHOD OF MEASURING RESISTANCE OF VIAS

INTRA-METAL CAPACITOR AND METHOD OF FORMING THE SAME

SEMICONDUCTOR DEVICE