CHIH-HAO HO

Person

ZHUBEI CITY, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Probe card and probe module thereof
- Patent number 11,585,832
- Issue date Feb 21, 2023
- MPI CORPORATION
- Chung-Yen Huang
- G01 - MEASURING TESTING
Information Patent Grant
Probe module supporting loopback test
- Patent number 10,295,567
- Issue date May 21, 2019
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Probe module with high stability
- Patent number 10,101,362
- Issue date Oct 16, 2018
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Multilayer circuit board
- Patent number 10,070,512
- Issue date Sep 4, 2018
- Wei-Cheng Ku
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Testing jig
- Patent number 10,054,627
- Issue date Aug 21, 2018
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Probe card having configurable structure for exchanging or swapping...
- Patent number 9,927,487
- Issue date Mar 27, 2018
- MPI Corporation
- Chao-Ching Huang
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever type probe card for high frequency signal transmission
- Patent number 9,835,651
- Issue date Dec 5, 2017
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Multilayer circuit board
- Patent number 9,622,348
- Issue date Apr 11, 2017
- MPI Corporation
- Wei-Cheng Ku
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Multilayer circuit board
- Patent number 9,596,769
- Issue date Mar 14, 2017
- MPI Corporation
- Wei-Cheng Ku
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Multilayer circuit board
- Patent number 9,545,002
- Issue date Jan 10, 2017
- MPI Corporation
- Wei-Cheng Ku
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Testing jig
- Patent number 9,410,986
- Issue date Aug 9, 2016
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Probe card having adjustable high frequency signal transmission pat...
- Patent number 8,816,713
- Issue date Aug 26, 2014
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Probe card having configurable structure for exchanging or swapping...
- Patent number 8,638,116
- Issue date Jan 28, 2014
- MPI Corporation
- Chao-Ching Huang
- G01 - MEASURING TESTING
Information Patent Grant
Probe for high frequency signal transmission
- Patent number 8,106,673
- Issue date Jan 31, 2012
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Probe for high frequency signal transmission and probe card using t...
- Patent number 7,791,359
- Issue date Sep 7, 2010
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Probing device
- Patent number 7,782,070
- Issue date Aug 24, 2010
- MJC Probe Incorporated
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
High-frequency probe card and transmission line for high-frequency...
- Patent number 7,683,645
- Issue date Mar 23, 2010
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever-type probe card for high frequency application
- Patent number 7,595,651
- Issue date Sep 29, 2009
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
STATIONARY PROBE, MOVABLE PROBE, AND PROBING DEVICE CAPABLE OF ADJU...
- Publication number 20240329083
- Publication date Oct 3, 2024
- MPI CORPORATION
- CHIA-NAN CHOU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD AND PROBE MODULE THEREOF
- Publication number 20210311095
- Publication date Oct 7, 2021
- MPI Corporation
- Chung-Yen Huang
- G01 - MEASURING TESTING
Information Patent Application
MULTILAYER CIRCUIT BOARD
- Publication number 20170150592
- Publication date May 25, 2017
- MPI Corporation
- WEI-CHENG KU
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
PROBE MODULE
- Publication number 20170115326
- Publication date Apr 27, 2017
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
PROBE MODULE SUPPORTING LOOPBACK TEST
- Publication number 20170003319
- Publication date Jan 5, 2017
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
Probe Card
- Publication number 20160305981
- Publication date Oct 20, 2016
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
HIGH-FREQUENCY CANTILEVER TYPE PROBE CARD
- Publication number 20160139179
- Publication date May 19, 2016
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
MULTILAYER CIRCUIT BOARD
- Publication number 20160143141
- Publication date May 19, 2016
- MPI CORPORATION
- WEI-CHENG KU
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
MULTILAYER CIRCUIT BOARD
- Publication number 20160128176
- Publication date May 5, 2016
- MPI CORPORATION
- WEI-CHENG KU
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
PROBE CARD, AND CONNECTING CIRCUIT BOARD AND SIGNAL FEEDING STRUCTU...
- Publication number 20160018441
- Publication date Jan 21, 2016
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD, AND CONNECTING CIRCUIT BOARD AND SIGNAL FEEDING STRUCTU...
- Publication number 20160018439
- Publication date Jan 21, 2016
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
TESTING JIG
- Publication number 20150204905
- Publication date Jul 23, 2015
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
TESTING JIG
- Publication number 20150204906
- Publication date Jul 23, 2015
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
PROBE MODULE
- Publication number 20150168453
- Publication date Jun 18, 2015
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
PROBE MODULE
- Publication number 20150168454
- Publication date Jun 18, 2015
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
MULTILAYER CIRCUIT BOARD
- Publication number 20150014046
- Publication date Jan 15, 2015
- MPI CORPORATION
- Wei-Cheng KU
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
CANTILEVER PROBE CARD FOR HIGH-FREQUENCY SIGNAL TRANSMISSION
- Publication number 20150015291
- Publication date Jan 15, 2015
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD HAVING CONFIGURABLE STRUCTURE FOR EXCHANGING OR SWAPPING...
- Publication number 20140103948
- Publication date Apr 17, 2014
- MPI CORPORATION
- Chao-Ching Huang
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD HAVING ADJUSTABLE HIGH FREQUENCY SIGNAL TRANSMISSION PAT...
- Publication number 20130021053
- Publication date Jan 24, 2013
- Wei-Cheng KU
- G01 - MEASURING TESTING
Information Patent Application
High-frequency coupling testing device by coupling effect
- Publication number 20120242360
- Publication date Sep 27, 2012
- Keng-Yi Huang
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD HAVING CONFIGURABLE STRUCTURE FOR EXCHANGING OR SWAPPING...
- Publication number 20110221462
- Publication date Sep 15, 2011
- Chao-Ching Huang
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR HIGH FREQUENCY SIGNAL TRANSMISSION
- Publication number 20100253378
- Publication date Oct 7, 2010
- MPI CORPORATION
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Application
PROBING DEVICE
- Publication number 20090009198
- Publication date Jan 8, 2009
- MJC Probe Incorporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Application
Cantilever-type probe card for high frequency application
- Publication number 20080191726
- Publication date Aug 14, 2008
- MJC PROBE INCORPORATION
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR HIGH FREQUENCY SIGNAL TRANSMISSION AND PROBE CARD USING T...
- Publication number 20080164900
- Publication date Jul 10, 2008
- MJC Probe Incorporation No.
- Wei-Cheng KU
- G01 - MEASURING TESTING
Information Patent Application
High-frequency probe card and transmission line for high-frequency...
- Publication number 20080007278
- Publication date Jan 10, 2008
- MJC Probe Incorporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING

CHIH-HAO HO

Person

Patents Grantslast 30 patents

Probe card and probe module thereof

Probe module supporting loopback test

Probe module with high stability

Multilayer circuit board

Testing jig

Probe card having configurable structure for exchanging or swapping...

Cantilever type probe card for high frequency signal transmission

Multilayer circuit board

Multilayer circuit board

Multilayer circuit board

Testing jig

Probe card having adjustable high frequency signal transmission pat...

Probe card having configurable structure for exchanging or swapping...

Probe for high frequency signal transmission

Probe for high frequency signal transmission and probe card using t...

Probing device

High-frequency probe card and transmission line for high-frequency...

Cantilever-type probe card for high frequency application

Patents Applicationslast 30 patents

STATIONARY PROBE, MOVABLE PROBE, AND PROBING DEVICE CAPABLE OF ADJU...

PROBE CARD AND PROBE MODULE THEREOF

MULTILAYER CIRCUIT BOARD

PROBE MODULE

PROBE MODULE SUPPORTING LOOPBACK TEST

Probe Card

HIGH-FREQUENCY CANTILEVER TYPE PROBE CARD

MULTILAYER CIRCUIT BOARD

MULTILAYER CIRCUIT BOARD

PROBE CARD, AND CONNECTING CIRCUIT BOARD AND SIGNAL FEEDING STRUCTU...

PROBE CARD, AND CONNECTING CIRCUIT BOARD AND SIGNAL FEEDING STRUCTU...

TESTING JIG

TESTING JIG

PROBE MODULE

PROBE MODULE

MULTILAYER CIRCUIT BOARD

CANTILEVER PROBE CARD FOR HIGH-FREQUENCY SIGNAL TRANSMISSION

PROBE CARD HAVING CONFIGURABLE STRUCTURE FOR EXCHANGING OR SWAPPING...

PROBE CARD HAVING ADJUSTABLE HIGH FREQUENCY SIGNAL TRANSMISSION PAT...

High-frequency coupling testing device by coupling effect

PROBE CARD HAVING CONFIGURABLE STRUCTURE FOR EXCHANGING OR SWAPPING...

PROBE FOR HIGH FREQUENCY SIGNAL TRANSMISSION

PROBING DEVICE

Cantilever-type probe card for high frequency application

PROBE FOR HIGH FREQUENCY SIGNAL TRANSMISSION AND PROBE CARD USING T...

High-frequency probe card and transmission line for high-frequency...