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Chih-Jen M. Lin
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Austin, TX, US
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Patents Grants
last 30 patents
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Patent Grant
System-on-chip, mobile terminal, and method for operating the syste...
Patent number
10,592,454
Issue date
Mar 17, 2020
Samsung Electronics Co., Ltd.
Jae-Youl Kim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System-on-chip, mobile terminal, and method for operating the syste...
Patent number
10,025,741
Issue date
Jul 17, 2018
Samsung Electronics Co., Ltd.
Jae-Youl Kim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Scalable scan system for system-on-chip design
Patent number
8,028,209
Issue date
Sep 27, 2011
Intel Corporation
Wei Li
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and apparatus for testing a memory array
Patent number
7,370,249
Issue date
May 6, 2008
Intel Corporation
Zhuoyu Bao
G11 - INFORMATION STORAGE
Information
Patent Grant
Flexible scan architecture
Patent number
7,216,274
Issue date
May 8, 2007
Intel Corporation
Talal K. Jaber
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Weighted random pattern test using pre-stored weights
Patent number
6,795,948
Issue date
Sep 21, 2004
Intel Corporation
Chih-Jen Lin
G01 - MEASURING TESTING
Information
Patent Grant
Memory fault isolation apparatus and methods
Patent number
6,622,269
Issue date
Sep 16, 2003
Intel Corporation
Nguyen N. Ngo
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
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Patent Application
SYSTEM-ON-CHIP, MOBILE TERMINAL, AND METHOD FOR OPERATING THE SYSTE...
Publication number
20170199835
Publication date
Jul 13, 2017
Samsung Electronics Co., Ltd.
Jae-Youl KIM
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SCALABLE SCAN SYSTEM FOR SYSTEM-ON-CHIP DESIGN
Publication number
20100332928
Publication date
Dec 30, 2010
Wei Li
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Flexible scan architecture
Publication number
20070168767
Publication date
Jul 19, 2007
Talal K. Jaber
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and apparatus for testing a memory array
Publication number
20050283688
Publication date
Dec 22, 2005
Zhuoyu Bao
G11 - INFORMATION STORAGE
Information
Patent Application
Flexible scan architecture
Publication number
20040267504
Publication date
Dec 30, 2004
Talal K. Jaber
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Weighted random pattern test using pre-stored weights
Publication number
20030074615
Publication date
Apr 17, 2003
Chih-Jen Lin
G01 - MEASURING TESTING