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Chih-Ming Ke

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  • Hsin-Chu, TW
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    PACKAGE STRUCTURE AND METHOD FOR FORMING THE SAME
    • Publication number 20240404962
    • Publication date Dec 5, 2024
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Pei-Hsuan LO
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    PHOTONIC DEVICE AND METHOD OF MANUFACTURE
    • Publication number 20240329336
    • Publication date Oct 3, 2024
    • Taiwan Semiconductor Manufacturing Co., Ltd.
    • Tung-Liang Shao
    • G02 - OPTICS
  • Information Patent Application

    Package with Improved Heat Dissipation Efficiency and Method for Fo...
    • Publication number 20240162109
    • Publication date May 16, 2024
    • Taiwan Semiconductor Manufacturing Co., Ltd.
    • Hung-Yi Kuo
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    METHOD OF MANUFACTURING SEMICONDUCTOR DEVICES
    • Publication number 20230378003
    • Publication date Nov 23, 2023
    • TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
    • Li-Chao YIN
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    Method of manufacturing semiconductor devices
    • Publication number 20210217670
    • Publication date Jul 15, 2021
    • Taiwan Semiconductor Manufacturing Co., Ltd.
    • Li-Chao Yin
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Noise Reduction for Overlay Control
    • Publication number 20200310255
    • Publication date Oct 1, 2020
    • Taiwan Semiconductor Manufacturing Co., LTD
    • Weimin Hu
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    Aperture Design and Methods Thereof
    • Publication number 20200284954
    • Publication date Sep 10, 2020
    • Taiwan Semiconductor Manufacturing Co., LTD
    • Hung-Chih Hsieh
    • G02 - OPTICS
  • Information Patent Application

    Forecasting Wafer Defects Using Frequency Domain Analysis
    • Publication number 20200125785
    • Publication date Apr 23, 2020
    • Taiwan Semiconductor Manufacturing Co., LTD
    • Yang-Hung Chang
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Method and System for Overlay Control
    • Publication number 20200124984
    • Publication date Apr 23, 2020
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Yang-Hung Chang
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Noise Reduction for Overlay Control
    • Publication number 20190258179
    • Publication date Aug 22, 2019
    • Taiwan Semiconductor Manufacturing Co., LTD
    • Weimin Hu
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    Aperture Design and Methods Thereof
    • Publication number 20190004220
    • Publication date Jan 3, 2019
    • Taiwan Semiconductor Manufacturing Co., Ltd.
    • Hung-Chih Hsieh
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    Method and System for Overlay Control
    • Publication number 20180329313
    • Publication date Nov 15, 2018
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Yang-Hung Chang
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    FORECASTING WAFER DEFECTS USING FREQUENCY DOMAIN ANALYSIS
    • Publication number 20180330040
    • Publication date Nov 15, 2018
    • Taiwan Semiconductor Manufacturing Co., Ltd.
    • Yang-Hung Chang
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    FORECASTING WAFER DEFECTS USING FREQUENCY DOMAIN ANALYSIS
    • Publication number 20180196911
    • Publication date Jul 12, 2018
    • TAIWAN SEMICONDUTOR MANUFACTURING CO., LTD.
    • Yang-Hung Chang
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Noise Reduction for Overlay Control
    • Publication number 20180173110
    • Publication date Jun 21, 2018
    • Taiwan Semiconductor Manufacturing Co., Ltd.
    • Weimin Hu
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    Spectroscopic Overlay Metrology
    • Publication number 20180172514
    • Publication date Jun 21, 2018
    • Taiwan Semiconductor Manufacturing Co., Ltd.
    • Kai Wu
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    METHOD OF EXTRACTING DEFECTS
    • Publication number 20170345725
    • Publication date Nov 30, 2017
    • Taiwan Semiconductor Manufacturing Co., LTD
    • Jia-Rui HU
    • G01 - MEASURING TESTING
  • Information Patent Application

    LIGHT-EMITTING ELEMENT
    • Publication number 20160315221
    • Publication date Oct 27, 2016
    • EPISTAR CORPORATION
    • Po Yuan CHEN
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    METHOD AND APPARATUS FOR ESTIMATING FOCUS AND DOSE OF AN EXPOSURE P...
    • Publication number 20160274456
    • Publication date Sep 22, 2016
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Yen-Liang Chen
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHOD AND APPARATUS TO CHARACTERIZE PHOTOLITHOGRAPHY LENS QUALITY
    • Publication number 20150316859
    • Publication date Nov 5, 2015
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Guo-Tsai Huang
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    Method and System For Overlay Control
    • Publication number 20150268564
    • Publication date Sep 24, 2015
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Yang-Hung Chang
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    METHOD AND APPARATUS FOR EXTRACTING SYSTEMATIC DEFECTS
    • Publication number 20150254394
    • Publication date Sep 10, 2015
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Jia-Rui Hu
    • G01 - MEASURING TESTING
  • Information Patent Application

    LIGHT-EMITTING DEVICE
    • Publication number 20150243845
    • Publication date Aug 27, 2015
    • EPISTAR CORPORATION
    • Peng-Ren CHEN
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Method and Apparatus For Maintaining Depth of Focus
    • Publication number 20150220006
    • Publication date Aug 6, 2015
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Chang-Tsun Hsieh
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    SYSTEMS AND METHODS FOR SIMILARITY-BASED SEMICONDUCTOR PROCESS CONTROL
    • Publication number 20150079700
    • Publication date Mar 19, 2015
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Chih-Ming Ke
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Method and System for Overlay Control
    • Publication number 20150067617
    • Publication date Mar 5, 2015
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Yang-Hung Chang
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    Method and Apparatus for Extracting Systematic Defects
    • Publication number 20140282334
    • Publication date Sep 18, 2014
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Jia-Rui Hu
    • G01 - MEASURING TESTING
  • Information Patent Application

    Two-Dimensional Marks
    • Publication number 20140253901
    • Publication date Sep 11, 2014
    • Wen-Zhan Zhou
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    Hybrid Focus-Exposure Matrix
    • Publication number 20140257761
    • Publication date Sep 11, 2014
    • Wen-Zhan Zhou
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    METHOD OF MANUFACTURING LIGHT EMITTING DEVICE PACKAGE
    • Publication number 20140134766
    • Publication date May 15, 2014
    • ADVANCED OPTOELECTRONIC TECHNOLOGY, INC.
    • SHIUN-WEI CHAN
    • H01 - BASIC ELECTRIC ELEMENTS