Chih-Yu Jen

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Time-dependent defect inspection apparatus
- Patent number 11,651,935
- Issue date May 16, 2023
- ASML Netherlands B.V.
- Chih-Yu Jen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for detecting time-dependent defects in a fast...
- Patent number 11,175,248
- Issue date Nov 16, 2021
- ASML Netherlands B.V.
- Long Ma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Time-dependent defect inspection apparatus
- Patent number 11,056,311
- Issue date Jul 6, 2021
- ASML Netherlands B.V.
- Chih-Yu Jen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR PULSED VOLTAGE CONTRAST DETECTION AND CAPTU...
- Publication number 20230335374
- Publication date Oct 19, 2023
- ASML NETHERLANDS B.V.
- Benoit Herve GAURY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR SIGNAL ELECTRON DETECTION IN AN INSPECTION...
- Publication number 20230298851
- Publication date Sep 21, 2023
- ASML NETHERLANDS B.V.
- Chih-Yu JEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHOTO-ELECTRICAL EVOLUTION DEFECT INSPECTION
- Publication number 20220270849
- Publication date Aug 25, 2022
- ASML NETHERLANDS B.V.
- Jun JIANG
- G01 - MEASURING TESTING
Information Patent Application
TIME-DEPENDENT DEFECT INSPECTION APPARATUS
- Publication number 20220005666
- Publication date Jan 6, 2022
- ASML NETHERLANDS B.V.
- Chih-Yu JEN
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR DETECTING TIME-DEPENDENT DEFECTS IN A FAST...
- Publication number 20200088659
- Publication date Mar 19, 2020
- ASML NETHERLANDS B.V.
- Long MA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TIME-DEPENDENT DEFECT INSPECTION APPARATUS
- Publication number 20200075287
- Publication date Mar 5, 2020
- ASML NETHERLANDS B.V.
- Chih-Yu Jen
- H01 - BASIC ELECTRIC ELEMENTS