Membership
Tour
Register
Log in
Chiharu Miyazaki
Follow
Person
Tokyo, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Electromagnetic field probe
Patent number
11,092,635
Issue date
Aug 17, 2021
Mitsubishi Electric Corporation
Tsuyoshi Kobayashi
G01 - MEASURING TESTING
Information
Patent Grant
Electronic machine
Patent number
10,893,625
Issue date
Jan 12, 2021
Mitsubishi Electric Corporation
Yuji Ando
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Cable coupling connector
Patent number
8,758,059
Issue date
Jun 24, 2014
Mitsubishi Electric Corporation
Yosuke Watanabe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Laminate LC filter having combined condenser and coil functions
Patent number
5,367,275
Issue date
Nov 22, 1994
Mitsubishi Denki Kabushiki Kaisha
Mitsunobu Esaki
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Laminate LC filter having combined condenser and coil functions
Patent number
5,227,746
Issue date
Jul 13, 1993
Mitsubishi Denki Kabushiki Kaisha
Mitsunobu Esaki
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
LASER DIODE DRIVE CIRCUIT AND COMMUNICATION DEVICE
Publication number
20210336413
Publication date
Oct 28, 2021
Mitsubishi Electric Corporation
Ryota KOBAYASHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NOISE DETECTION CIRCUIT
Publication number
20200264225
Publication date
Aug 20, 2020
Mitsubishi Electric Corporation
Ryota KOBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC MACHINE
Publication number
20200120824
Publication date
Apr 16, 2020
Mitsubishi Electric Corporation
Yuji ANDO
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
ELECTROMAGNETIC FIELD PROBE
Publication number
20190361062
Publication date
Nov 28, 2019
Mitsubishi Electric Corporation
Yusuke YAMAKAJI
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMAGNETIC FIELD PROBE
Publication number
20190339317
Publication date
Nov 7, 2019
Mitsubishi Electric Corporation
Tsuyoshi KOBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMAGNETIC FIELD PROBE
Publication number
20190113555
Publication date
Apr 18, 2019
Mitsubishi Electric Corporation
Ryota KOBAYASHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CABLE COUPLING CONNECTOR
Publication number
20120309230
Publication date
Dec 6, 2012
Mitsubishi Electric Corporation
Yosuke Watanabe
H01 - BASIC ELECTRIC ELEMENTS