Chihiro KAWAHARA

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Chiyoda-ku, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device reliability evaluation apparatus and semicondu...
- Patent number 11,808,801
- Issue date Nov 7, 2023
- Mitsubishi Electric Corporation
- Chihiro Kawahara
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and power conversion device
- Patent number 11,750,090
- Issue date Sep 5, 2023
- Mitsubishi Electric Corporation
- Chihiro Kawahara
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Semiconductor device
- Patent number 11,346,879
- Issue date May 31, 2022
- Mitsubishi Electric Corporation
- Chihiro Kawahara
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND POWER CONVERSION DEVICE
- Publication number 20240291402
- Publication date Aug 29, 2024
- Mitsubishi Electric Corporation
- Chihiro KAWAHARA
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
DRIVING DEVICE FOR SEMICONDUCTOR ELEMENT, AND POWER CONVERSION DEVICE
- Publication number 20240146179
- Publication date May 2, 2024
- Mitsubishi Electric Corporation
- Koki OCHI
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SEMICONDUCTOR DEVICE AND POWER CONVERSION DEVICE
- Publication number 20220077771
- Publication date Mar 10, 2022
- Mitsubishi Electric Corporation
- Chihiro KAWAHARA
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SEMICONDUCTOR DEVICE RELIABILITY EVALUATION APPARATUS AND SEMICONDU...
- Publication number 20210116493
- Publication date Apr 22, 2021
- Mitsubishi Electric Corporation
- Chihiro KAWAHARA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20200116780
- Publication date Apr 16, 2020
- MITSUBISHI ELECTRIC CORPORATION
- Chihiro KAWAHARA
- G01 - MEASURING TESTING