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Chihiro Wakai
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Tokyo, JP
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Patents Grants
last 30 patents
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Patent Grant
NMR probe for high-temperature measurements
Patent number
7,345,484
Issue date
Mar 18, 2008
Kyoto University
Masaru Nakahara
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Nmr Probe for High-Temperature Measurements
Publication number
20070257673
Publication date
Nov 8, 2007
Kyoto University
Masaru Nakahara
G01 - MEASURING TESTING