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Chihtung Chen
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San Diego, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Testing method and testing system
Patent number
10,914,785
Issue date
Feb 9, 2021
Realtek Semiconductor Corporation
Chihtung Chen
G01 - MEASURING TESTING
Information
Patent Grant
Testing method and testing system
Patent number
10,598,730
Issue date
Mar 24, 2020
Realtek Semiconductor Corporation
Chihtung Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Concurrent multiple-dimension word-addressable memory architecture
Patent number
8,773,944
Issue date
Jul 8, 2014
QUALCOMM Incorporated
Chihtung Chen
G11 - INFORMATION STORAGE
Information
Patent Grant
Concurrent multiple-dimension word-addressable memory architecture
Patent number
8,120,989
Issue date
Feb 21, 2012
QUALCOMM Incorporated
Chihtung Chen
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
Information
Patent Application
INTEGRATED CIRCUITRY DEVELOPMENT SYSTEM, INTEGRATED CIRCUITRY DEVEL...
Publication number
20200210534
Publication date
Jul 2, 2020
REALTEK SEMICONDUCTOR CORPORATION
Chihtung CHEN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
TESTING METHOD AND TESTING SYSTEM
Publication number
20200150176
Publication date
May 14, 2020
REALTEK SEMICONDUCTOR CORPORATION
Chihtung CHEN
G01 - MEASURING TESTING
Information
Patent Application
CONCURRENT MULTIPLE-DIMENSION WORD-ADDRESSABLE MEMORY ARCHITECTURE
Publication number
20120134229
Publication date
May 31, 2012
Chihtung Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Concurrent Multiple-Dimension Word-Addressable Memory Architecture
Publication number
20080316835
Publication date
Dec 25, 2008
Chihtung Chen
G06 - COMPUTING CALCULATING COUNTING