Chikaomi Mori

Person

Hyogo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Probe card case and probe card transfer method
- Patent number 10,908,180
- Issue date Feb 2, 2021
- Japan Electronic Materials Corp.
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Grant
Probe guide plate having a silicon oxide layer formed on surfaces a...
- Patent number 10,261,110
- Issue date Apr 16, 2019
- Shinko Electric Industries Co., Ltd.
- Yuichiro Shimizu
- G01 - MEASURING TESTING
Information Patent Grant
Probe card case and probe card transfer method
- Patent number 10,184,954
- Issue date Jan 22, 2019
- Japan Electronic Materials Corp.
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Grant
Probe guide, probe card, and method for probe guide manufacturing
- Patent number 10,139,430
- Issue date Nov 27, 2018
- Shinko Electric Industries Co., Ltd.
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Grant
Probe card case
- Patent number D751555
- Issue date Mar 15, 2016
- JAPAN ELECTRONIC MATERIALS CORP.
- Chikaomi Mori
- D14 - Recording, communication, or information retrieval equipment
Information Patent Grant
Probe card
- Patent number 7,307,435
- Issue date Dec 11, 2007
- Nihon Denshizairyo Kabushiki Kaisha
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and contactor of the same
- Patent number 7,106,080
- Issue date Sep 12, 2006
- Japan Electronic Materials Corporation
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for examining semiconductor devices on semiconductor wafers
- Patent number 7,081,766
- Issue date Jul 25, 2006
- Japan Electronic Materials Corp.
- Katsuhiko Satou
- G01 - MEASURING TESTING
Information Patent Grant
Probe card having a coil spring interposed between a support member...
- Patent number 7,075,319
- Issue date Jul 11, 2006
- Nihon Denshizairyo Kabushiki Kaisha
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Grant
Probe card and contactor of the same
- Patent number 6,967,493
- Issue date Nov 22, 2005
- Japan Electronic Materials Corporation
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for connecting between substrates
- Patent number 6,836,024
- Issue date Dec 28, 2004
- Nihon Denshizairyo Kabushiki Kaisha
- Chikaomi Mori
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD
- Publication number 20230266365
- Publication date Aug 24, 2023
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Chikaomi MORI
- G01 - MEASURING TESTING
Information Patent Application
Probe Guide, Probe Card, And Method For Probe Guide Manufacturing
- Publication number 20170242057
- Publication date Aug 24, 2017
- JAPAN ELECTRONIC MATERIALS CORPORATION
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD CASE AND PROBE CARD TRANSFER METHOD
- Publication number 20170153272
- Publication date Jun 1, 2017
- JAPAN ELECTRONIC MATERIALS CORP.
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Application
PROBE GUIDE PLATE AND PROBE APPARATUS
- Publication number 20170146569
- Publication date May 25, 2017
- Shinko Electric Industries Co., Ltd.
- Yuichiro Shimizu
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD CASE AND PROBE CARD TRANSFER METHOD
- Publication number 20150285838
- Publication date Oct 8, 2015
- TOKYO ELECTRON LIMITED
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Application
PROBE
- Publication number 20110291685
- Publication date Dec 1, 2011
- Japan Electronic Materials Corp.
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Application
Probe card and contactor of the same
- Publication number 20060076966
- Publication date Apr 13, 2006
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Application
Probe card
- Publication number 20060061375
- Publication date Mar 23, 2006
- Nihon Denshizairyo Kabushiki Kaisha
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Application
Connection pin
- Publication number 20050093559
- Publication date May 5, 2005
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Application
Probe card and contactor of the same
- Publication number 20050083072
- Publication date Apr 21, 2005
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Application
Probe card
- Publication number 20040257098
- Publication date Dec 23, 2004
- Katsuhiko Satou
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR CONNECTING BETWEEN SUBSTRATES
- Publication number 20040222535
- Publication date Nov 11, 2004
- Chikaomi Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Probe card
- Publication number 20040104738
- Publication date Jun 3, 2004
- Nihon Denshizairyo Kabushiki Kaisha
- Chikaomi Mori
- G01 - MEASURING TESTING
Information Patent Application
Method for producing a probe, mask for producing the probe, and probe
- Publication number 20030234657
- Publication date Dec 25, 2003
- Chikaomi Mori
- G01 - MEASURING TESTING

Chikaomi Mori

Person

Patents Grantslast 30 patents

Probe card case and probe card transfer method

Probe guide plate having a silicon oxide layer formed on surfaces a...

Probe card case and probe card transfer method

Probe guide, probe card, and method for probe guide manufacturing

Probe card case

Probe card

Probe card and contactor of the same

Probe card for examining semiconductor devices on semiconductor wafers

Probe card having a coil spring interposed between a support member...

Probe card and contactor of the same

Apparatus for connecting between substrates

Patents Applicationslast 30 patents

PROBE CARD

Probe Guide, Probe Card, And Method For Probe Guide Manufacturing

PROBE CARD CASE AND PROBE CARD TRANSFER METHOD

PROBE GUIDE PLATE AND PROBE APPARATUS

PROBE CARD CASE AND PROBE CARD TRANSFER METHOD

PROBE

Probe card and contactor of the same

Probe card

Connection pin

Probe card and contactor of the same

Probe card

APPARATUS FOR CONNECTING BETWEEN SUBSTRATES

Probe card

Method for producing a probe, mask for producing the probe, and probe