Chikashi TAKEUCHI

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Yokohama-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Impurity analysis device and method
- Patent number 8,932,954
- Issue date Jan 13, 2015
- Kabushiki Kaisha Toshiba
- Yuji Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample contamination method
- Patent number 8,771,535
- Issue date Jul 8, 2014
- Kabushiki Kaisha Toshiba
- Yuji Yamada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IMPURITY ANALYSIS DEVICE AND METHOD
- Publication number 20130244349
- Publication date Sep 19, 2013
- Yuji Yamada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE CONTAMINATION METHOD
- Publication number 20120149199
- Publication date Jun 14, 2012
- Yuji YAMADA
- G01 - MEASURING TESTING