Chiko Otani

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Wako-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Optical interference measuring apparatus and optical interference m...
- Patent number 12,000,699
- Issue date Jun 4, 2024
- Topcon Corporation
- Homare Momiyama
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz wave generating method and apparatus
- Patent number 8,369,002
- Issue date Feb 5, 2013
- Riken
- Ken-ichiro Maki
- G02 - OPTICS
Information Patent Grant
Terahertz beam scanning apparatus and method thereof
- Patent number 8,121,157
- Issue date Feb 21, 2012
- Riken
- Ken-ichiro Maki
- G02 - OPTICS
Information Patent Grant
Enclosure inspection method and apparatus thereof
- Patent number 7,697,745
- Issue date Apr 13, 2010
- Riken
- Chiko Otani
- G01 - MEASURING TESTING
Information Patent Grant
Broadband telescope
- Patent number 7,450,299
- Issue date Nov 11, 2008
- Riken
- Yoshiyuki Takizawa
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL INTERFERENCE MEASURING APPARATUS AND OPTICAL INTERFERENCE M...
- Publication number 20220228850
- Publication date Jul 21, 2022
- TOPCON CORPORATION
- Homare MOMIYAMA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INTERFERENCE MEASURING APPARATUS AND OPTICAL INTERFERENCE M...
- Publication number 20220221266
- Publication date Jul 14, 2022
- TOPCON CORPORATION
- Homare MOMIYAMA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20110216312
- Publication date Sep 8, 2011
- HAMAMATSU PHOTONICS K. K.
- Toru Matsumoto
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ WAVE GENERATING METHOD AND APPARATUS
- Publication number 20110038032
- Publication date Feb 17, 2011
- Riken
- Ken-ichiro Maki
- G02 - OPTICS
Information Patent Application
TERAHERTZ BEAM SCANNING APPARATUS AND METHOD THEREOF
- Publication number 20110037001
- Publication date Feb 17, 2011
- Riken
- Ken-ichiro Maki
- G02 - OPTICS
Information Patent Application
Enclosure inspection method and apparatus thereof
- Publication number 20070009085
- Publication date Jan 11, 2007
- Chiko Otani
- G01 - MEASURING TESTING
Information Patent Application
Broadband telescope
- Publication number 20050122603
- Publication date Jun 9, 2005
- Yoshiyuki Takizawa
- G02 - OPTICS