TREA

Chin Chai Gan

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  • Melaka, MY
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Patents Grantslast 30 patents

  • Information Patent Grant

    Spring-based probe pin that allows kelvin testing
    • Patent number 7,271,606
    • Issue date Sep 18, 2007
    • National Semiconductor Corporation
    • Tze Kang Tang
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Bilevel probe
    • Patent number 7,102,371
    • Issue date Sep 5, 2006
    • National Semiconductor Corporation
    • Tze Kang Tang
    • G01 - MEASURING TESTING