CHIN-FA TU

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Hsinchu City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Load lock system for charged particle beam imaging
- Patent number 10,643,818
- Issue date May 5, 2020
- ASML Netherlands B.V.
- Hsuan-Bin Huang
- G01 - MEASURING TESTING
Information Patent Grant
Two-sided scanning device having brightness calibration components...
- Patent number 10,447,867
- Issue date Oct 15, 2019
- Avision Inc.
- Te-Hsun Liu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Load lock system for charged particle beam imaging
- Patent number 10,176,967
- Issue date Jan 8, 2019
- Hermes-Microvision, Inc.
- Hsuan-Bin Huang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LOAD LOCK SYSTEM FOR CHARGED PARTICLE BEAM IMAGING
- Publication number 20190214225
- Publication date Jul 11, 2019
- HERMES MICROVISION, INC.
- Hsuan-Bin HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TWO-SIDED SCANNING DEVICE HAVING BRIGHTNESS CALIBRATION COMPONENTS...
- Publication number 20190007576
- Publication date Jan 3, 2019
- Avision Inc.
- Te-Hsun Liu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
LOAD LOCK SYSTEM FOR CHARGED PARTICLE BEAM IMAGING
- Publication number 20180240645
- Publication date Aug 23, 2018
- HERMES MICROVISION INC.
- HSUAN-BIN HUANG
- H01 - BASIC ELECTRIC ELEMENTS