Chin-Hsing Su

Person

Hsinchu, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Memory cell array circuit and method of forming the same
- Patent number 12,165,705
- Issue date Dec 10, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chin-I Su
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-volatile memory based compute-in-memory cell
- Patent number 12,131,776
- Issue date Oct 29, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Zheng-Jun Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory cell array circuit and method of forming the same
- Patent number 11,735,263
- Issue date Aug 22, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chin-I Su
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic inhibit voltage to reduce write power for random-access memory
- Patent number 11,715,518
- Issue date Aug 1, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Zheng-Jun Lin
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory cell array circuit and method of forming the same
- Patent number 11,636,896
- Issue date Apr 25, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chin-I Su
- G11 - INFORMATION STORAGE
Information Patent Grant
Low-dropout (LDO) regulator with a feedback circuit
- Patent number 11,442,482
- Issue date Sep 13, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Zheng-Jun Lin
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Strained-channel semiconductor device fabrication
- Patent number RE47562
- Issue date Aug 6, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chun-Fai Cheng
Information Patent Grant
Conductive plug and method of forming the same
- Patent number 9,685,373
- Issue date Jun 20, 2017
- Macronix International Co., Ltd.
- Meng-Tsung Ko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory-testing device and memory-testing method
- Patent number 9,653,186
- Issue date May 16, 2017
- Mediatek Inc.
- Chin-Jung Su
- G11 - INFORMATION STORAGE
Information Patent Grant
Gas-supply system and method
- Patent number 9,632,516
- Issue date Apr 25, 2017
- TAWAN SEMICONDUCTOR MANUFACTURING CO., LTD
- Yung-Long Chen
- G05 - CONTROLLING REGULATING
Information Patent Grant
Strained asymmetric source/drain
- Patent number 9,627,507
- Issue date Apr 18, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chun-Fai Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chemical mechanical planarization process and structures
- Patent number 9,431,287
- Issue date Aug 30, 2016
- Macronix International Co., Ltd.
- Yi Sheng Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple silicide integration structure and method
- Patent number 9,391,067
- Issue date Jul 12, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Der-Chyang Yeh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure and method for manufacturing the same
- Patent number 9,252,102
- Issue date Feb 2, 2016
- Macronix International Co., Ltd.
- Bing-Lung Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Kink poly structure for improving random single bit failure
- Patent number 9,117,752
- Issue date Aug 25, 2015
- Macronix International Co., Ltd.
- Shing Ann Luo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device comprising a surface portion implanted with ni...
- Patent number 9,070,634
- Issue date Jun 30, 2015
- Macronix International Co., Ltd.
- Chien-Lan Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for semiconductor wafer processing with side/beve...
- Patent number 9,045,838
- Issue date Jun 2, 2015
- Macronix International Co., Ltd.
- Meng Tsung Ko
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Multiple silicide integration structure and method
- Patent number 8,993,393
- Issue date Mar 31, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Der-Chyang Yeh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Strained asymmetric source/drain
- Patent number 8,928,094
- Issue date Jan 6, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chun-Fai Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Strained-channel semiconductor device fabrication
- Patent number 8,872,228
- Issue date Oct 28, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chun-Fai Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating conductive lines of a semiconductor device
- Patent number 8,828,861
- Issue date Sep 9, 2014
- Macronix International Co., Ltd.
- Tuung Luoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Isolation structure, non-volatile memory having the same, and metho...
- Patent number 8,653,592
- Issue date Feb 18, 2014
- Macronix International Co., Ltd.
- Ming-Da Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal silicide formation
- Patent number 8,580,680
- Issue date Nov 12, 2013
- Macronix International Co., Ltd.
- Tuung Luoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a deposited material by utilizing a multi-step de...
- Patent number 8,520,194
- Issue date Aug 27, 2013
- Macronix International Co., Ltd.
- Tuung Luoh
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device having plural conductive layers disposed withi...
- Patent number 8,519,541
- Issue date Aug 27, 2013
- Macronix International Co., Ltd.
- Tuung Luoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a semiconductor device
- Patent number 8,445,982
- Issue date May 21, 2013
- Macronix International Co., Ltd.
- Chin-Tsan Yeh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus of generating a soft value for a memory device
- Patent number 8,332,728
- Issue date Dec 11, 2012
- Skymedi Corporation
- Chuang Cheng
- G11 - INFORMATION STORAGE
Information Patent Grant
Conductor removal process
- Patent number 8,288,280
- Issue date Oct 16, 2012
- Macronix International Co., Ltd.
- Yung-Tai Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of depositing a silicon-containing material by utilizing a m...
- Patent number 8,184,288
- Issue date May 22, 2012
- Macronix International Co., Ltd.
- Tuung Luoh
- G01 - MEASURING TESTING
Information Patent Grant
Multivariate monitoring method for plasma process machine
- Patent number 8,085,390
- Issue date Dec 27, 2011
- Macronix International Co., Ltd.
- Tuung Luoh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
NON-VOLATILE MEMORY BASED COMPUTE-IN-MEMORY CELL
- Publication number 20240379155
- Publication date Nov 14, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Zheng-Jun LIN
- G11 - INFORMATION STORAGE
Information Patent Application
LOW-DROPOUT (LDO) REGULATOR WITH A FEEDBACK CIRCUIT
- Publication number 20240036597
- Publication date Feb 1, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Zheng-Jun LIN
- G05 - CONTROLLING REGULATING
Information Patent Application
MEMORY CELL ARRAY CIRCUIT AND METHOD OF FORMING THE SAME
- Publication number 20230377648
- Publication date Nov 23, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chin-I SU
- G11 - INFORMATION STORAGE
Information Patent Application
NOVEL DYNAMIC INHIBIT VOLTAGE TO REDUCE WRITE POWER FOR RANDOM-ACCE...
- Publication number 20230335189
- Publication date Oct 19, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Zheng-Jun Lin
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY CELL ARRAY CIRCUIT AND METHOD OF FORMING THE SAME
- Publication number 20230253041
- Publication date Aug 10, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chin-I SU
- G11 - INFORMATION STORAGE
Information Patent Application
NON-VOLATILE MEMORY BASED COMPUTE-IN-MEMORY CELL
- Publication number 20230162785
- Publication date May 25, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Zheng-Jun LIN
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY CELL ARRAY CIRCUIT AND METHOD OF FORMING THE SAME
- Publication number 20220359010
- Publication date Nov 10, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chin-I SU
- G11 - INFORMATION STORAGE
Information Patent Application
DYNAMIC INHIBIT VOLTAGE TO REDUCE WRITE POWER FOR RANDOM-ACCESS MEMORY
- Publication number 20220254412
- Publication date Aug 11, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Zheng-Jun Lin
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY CELL ARRAY CIRCUIT AND METHOD OF FORMING THE SAME
- Publication number 20210407594
- Publication date Dec 30, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chin-I SU
- G11 - INFORMATION STORAGE
Information Patent Application
LOW-DROPOUT (LDO) REGULATOR
- Publication number 20210096586
- Publication date Apr 1, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Zheng-Jun Lin
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
CONDUCTIVE PLUG AND METHOD OF FORMING THE SAME
- Publication number 20170011960
- Publication date Jan 12, 2017
- Macronix International Co., Ltd.
- Meng-Tsung Ko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD FOR THE SAME
- Publication number 20160351493
- Publication date Dec 1, 2016
- Macronix International Co., Ltd.
- Chien-Lan Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20150357286
- Publication date Dec 10, 2015
- Macronix International Co., Ltd.
- Bing-Lung Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY-TESTING DEVICE AND MEMORY-TESTING METHOD
- Publication number 20150228360
- Publication date Aug 13, 2015
- MEDIATEK INC.
- Chin-Jung SU
- G11 - INFORMATION STORAGE
Information Patent Application
Multiple Silicide Integration Structure and Method
- Publication number 20150206871
- Publication date Jul 23, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Der-Chyang Yeh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A SEMICONDUCTOR DEVICE COMPRISING A SURFACE PORTION IMPLANTED WITH...
- Publication number 20150187595
- Publication date Jul 2, 2015
- Macronix International Co., Ltd.
- Chien-Lan Chiu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS-SUPPLY SYSTEM AND METHOD
- Publication number 20150177745
- Publication date Jun 25, 2015
- Taiwan Semiconductor Manufacturing Co., LTD
- Yung-Long CHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRAINED ASYMMETRIC SOURCE/DRAIN
- Publication number 20150179760
- Publication date Jun 25, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chun-Fai Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHEMICAL MECHANICAL PLANARIZATION PROCESS AND STRUCTURES
- Publication number 20140167208
- Publication date Jun 19, 2014
- Macronix International Co., Ltd.
- Yi Sheng CHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR PROCESS GAS FLOW CONTROL APPARATUS
- Publication number 20140120735
- Publication date May 1, 2014
- Macronix International Co., Ltd.
- Shing Ann LUO
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD TO IMPROVE WITHIN WAFER UNIFORMITY OF CMP PROCESS
- Publication number 20140015107
- Publication date Jan 16, 2014
- MACRONIX INTERNATIONAL CO., LTD.
- Ching-Kun Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRAINED-CHANNEL SEMICONDUCTOR DEVICE FABRICATION
- Publication number 20130299910
- Publication date Nov 14, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chun-Fai Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTACT OR VIA CRITICAL DIMENSION CONTROL WITH NOVEL CLOSED LOOP CO...
- Publication number 20130241075
- Publication date Sep 19, 2013
- MACRONIX INTERNATIONAL CO., LTD.
- Chin-Tsan Yeh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
KINK POLY STRUCTURE FOR IMPROVING RANDOM SINGLE BIT FAILURE
- Publication number 20130113031
- Publication date May 9, 2013
- Macronix International Co., Ltd.
- Shing Ann Luo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR SEMICONDUCTOR WAFER PROCESSING WITH SIDE/BEVE...
- Publication number 20130052823
- Publication date Feb 28, 2013
- MACRONIX INTERNATIONAL CO., LTD.
- Meng Tsung Ko
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
POLYSILICON STRUCTURE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20120313214
- Publication date Dec 13, 2012
- Macronix International Co., Ltd.
- Chin-Tsan Yeh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL SILICIDE FORMATION
- Publication number 20120104516
- Publication date May 3, 2012
- Macronix International Co., Ltd.
- Tuung Luoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRAINED ASYMMETRIC SOURCE/DRAIN
- Publication number 20120056276
- Publication date Mar 8, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd., ("TSMC")
- Chun-Fai Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ISOLATION STRUCTURE, NON-VOLATILE MEMORY HAVING THE SAME, AND METHO...
- Publication number 20120049269
- Publication date Mar 1, 2012
- Macronix International Co., Ltd.
- Ming-Da Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FABRICATING CONDUCTIVE LINES
- Publication number 20120043657
- Publication date Feb 23, 2012
- Macronix International Co., Ltd.
- Tuung Luoh
- H01 - BASIC ELECTRIC ELEMENTS

Chin-Hsing Su

Person

Patents Grantslast 30 patents

Memory cell array circuit and method of forming the same

Non-volatile memory based compute-in-memory cell

Memory cell array circuit and method of forming the same

Dynamic inhibit voltage to reduce write power for random-access memory

Memory cell array circuit and method of forming the same

Low-dropout (LDO) regulator with a feedback circuit

Strained-channel semiconductor device fabrication

Conductive plug and method of forming the same

Memory-testing device and memory-testing method

Gas-supply system and method

Strained asymmetric source/drain

Chemical mechanical planarization process and structures

Multiple silicide integration structure and method

Semiconductor structure and method for manufacturing the same

Kink poly structure for improving random single bit failure

Semiconductor device comprising a surface portion implanted with ni...

System and method for semiconductor wafer processing with side/beve...

Multiple silicide integration structure and method

Strained asymmetric source/drain

Strained-channel semiconductor device fabrication

Method for fabricating conductive lines of a semiconductor device

Isolation structure, non-volatile memory having the same, and metho...

Metal silicide formation

Method of forming a deposited material by utilizing a multi-step de...

Semiconductor device having plural conductive layers disposed withi...

Method of forming a semiconductor device

Method and apparatus of generating a soft value for a memory device

Conductor removal process

Method of depositing a silicon-containing material by utilizing a m...

Multivariate monitoring method for plasma process machine

Patents Applicationslast 30 patents

NON-VOLATILE MEMORY BASED COMPUTE-IN-MEMORY CELL

LOW-DROPOUT (LDO) REGULATOR WITH A FEEDBACK CIRCUIT

MEMORY CELL ARRAY CIRCUIT AND METHOD OF FORMING THE SAME

NOVEL DYNAMIC INHIBIT VOLTAGE TO REDUCE WRITE POWER FOR RANDOM-ACCE...

MEMORY CELL ARRAY CIRCUIT AND METHOD OF FORMING THE SAME

NON-VOLATILE MEMORY BASED COMPUTE-IN-MEMORY CELL

MEMORY CELL ARRAY CIRCUIT AND METHOD OF FORMING THE SAME

DYNAMIC INHIBIT VOLTAGE TO REDUCE WRITE POWER FOR RANDOM-ACCESS MEMORY

MEMORY CELL ARRAY CIRCUIT AND METHOD OF FORMING THE SAME

LOW-DROPOUT (LDO) REGULATOR

CONDUCTIVE PLUG AND METHOD OF FORMING THE SAME

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD FOR THE SAME

SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME

MEMORY-TESTING DEVICE AND MEMORY-TESTING METHOD

Multiple Silicide Integration Structure and Method

A SEMICONDUCTOR DEVICE COMPRISING A SURFACE PORTION IMPLANTED WITH...

GAS-SUPPLY SYSTEM AND METHOD

STRAINED ASYMMETRIC SOURCE/DRAIN

CHEMICAL MECHANICAL PLANARIZATION PROCESS AND STRUCTURES

SEMICONDUCTOR PROCESS GAS FLOW CONTROL APPARATUS

METHOD TO IMPROVE WITHIN WAFER UNIFORMITY OF CMP PROCESS

STRAINED-CHANNEL SEMICONDUCTOR DEVICE FABRICATION

CONTACT OR VIA CRITICAL DIMENSION CONTROL WITH NOVEL CLOSED LOOP CO...

KINK POLY STRUCTURE FOR IMPROVING RANDOM SINGLE BIT FAILURE

SYSTEM AND METHOD FOR SEMICONDUCTOR WAFER PROCESSING WITH SIDE/BEVE...

POLYSILICON STRUCTURE AND METHOD OF MANUFACTURING THE SAME

METAL SILICIDE FORMATION

STRAINED ASYMMETRIC SOURCE/DRAIN

ISOLATION STRUCTURE, NON-VOLATILE MEMORY HAVING THE SAME, AND METHO...

METHOD FOR FABRICATING CONDUCTIVE LINES