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Chin Keong Ng
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Singapore, SG
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Patents Grants
last 30 patents
Information
Patent Grant
Method for operating a test system and operation assistance apparatus
Patent number
11,536,769
Issue date
Dec 27, 2022
Rohde & Schwarz GmbH & Co. KG
Johann Tost
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for a vehicle, method for controlling the same, and displ...
Patent number
11,332,010
Issue date
May 17, 2022
Continental Automotive GmbH
Chin Tak Ng
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Levelling rod, level determining apparatus for said rod, and level...
Patent number
7,644,505
Issue date
Jan 12, 2010
Leica Geosystems AG
Zheng Dong Zeng
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring the instantaneous frequency of F...
Patent number
6,630,820
Issue date
Oct 7, 2003
Matsushita Electric Industrial Co., Ltd.
Mi Michael Bi
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for measuring the instantaneous frequency of F...
Patent number
6,483,286
Issue date
Nov 19, 2002
Matsushita Electric Industrial Co., Ltd.
Mi Michael Bi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
APPARATUS FOR A VEHICLE, METHOD FOR CONTROLLING THE SAME, AND DISPL...
Publication number
20210276419
Publication date
Sep 9, 2021
CONTINENTAL AUTOMOTIVE GMBH
Chin Tak Ng
B60 - VEHICLES IN GENERAL
Information
Patent Application
METHOD FOR OPERATING A TEST SYSTEM AND OPERATION ASSISTANCE APPARATUS
Publication number
20200309854
Publication date
Oct 1, 2020
Rohde& Schwarz GmbH & Co. KG
Johann Tost
G01 - MEASURING TESTING
Information
Patent Application
Levelling Rod, Level Determining Apparatus for Said Rod, and Level...
Publication number
20070289152
Publication date
Dec 20, 2007
Leica Geosystems AG
Zheng Dong Zeng
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for measuring the instantaneous frequency of F...
Publication number
20030052662
Publication date
Mar 20, 2003
Matsushita Electric Industrial Co., Ltd.
Mi Michael Bi
G01 - MEASURING TESTING