Ching Che Yang

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
LTPS multilayered structure and method for measuring misalignment i...
- Patent number 10,260,872
- Issue date Apr 16, 2019
- Everdisplay Optronics (Shanghai) Limited
- Ching Che Yang
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
LTPS MULTILAYERED STRUCTURE AND METHOD FOR MEASURING MISALIGNMENT I...
- Publication number 20150294941
- Publication date Oct 15, 2015
- EverDisplay Optronics (Shanghai) Limited
- Ching Che Yang
- G01 - MEASURING TESTING