Membership
Tour
Register
Log in
Ching-Hsiang Hsu Charles
Follow
Person
Hsinchu, TW
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Method and device for addressable failure site test structure
Patent number
6,577,149
Issue date
Jun 10, 2003
Taiwan Semiconductor Manufacturing Co., Ltd.
Yih-Yuh Doong
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Method and device for semiconductor wafer testing
Publication number
20020089345
Publication date
Jul 11, 2002
Yih-Yuh Doong
H01 - BASIC ELECTRIC ELEMENTS