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Ching-Kit CHAN
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Los Angeles, CA, US
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last 30 patents
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Patent Grant
Far-infrared detection using Weyl semimetals
Patent number
10,090,466
Issue date
Oct 2, 2018
Massachusetts Institute of Technology
Ching-Kit Chan
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
FAR-INFRARED DETECTION USING WEYL SEMIMETALS
Publication number
20180026185
Publication date
Jan 25, 2018
Massachusetts Institute of Technology
Ching-Kit CHAN
G01 - MEASURING TESTING