Ching-Ly Yueh

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Hsin-Chu City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Wafer searching method and device
- Patent number 11,960,814
- Issue date Apr 16, 2024
- Powerchip Semiconductor Manufacturing Corporation
- Jr-Rung Shiu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for generating chip probing wafer map
- Patent number 11,852,673
- Issue date Dec 26, 2023
- Powerchip Semiconductor Manufacturing Corporation
- Ying-Ju Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer map identification method and computer-readable recording medium
- Patent number 11,132,790
- Issue date Sep 28, 2021
- Powerchip Semiconductor Manufacturing Corporation
- Chiu-Chieh Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Nonparametric method for measuring clustered level of time rank in...
- Patent number 9,904,660
- Issue date Feb 27, 2018
- Powerchip Technology Corporation
- Li-Chin Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for analyzing wafer test parameters
- Patent number 6,968,280
- Issue date Nov 22, 2005
- Powerchip Semiconductor Corp.
- Hung-En Tai
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
WAFER SEARCHING METHOD AND DEVICE
- Publication number 20220414312
- Publication date Dec 29, 2022
- Powerchip Semiconductor Manufacturing Corporation
- Jr-Rung Shiu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER MAP IDENTIFICATION METHOD AND COMPUTER-READABLE RECORDING MEDIUM
- Publication number 20210166362
- Publication date Jun 3, 2021
- Powerchip Semiconductor Manufacturing Corporation
- Chiu-Chieh Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NONPARAMETRIC METHOD FOR MEASURING CLUSTERED LEVEL OF TIME RANK IN...
- Publication number 20180060280
- Publication date Mar 1, 2018
- POWERCHIP TECHNOLOGY CORPORATION
- Li-Chin Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR ANALYZING WAFER TEST PARAMETERS
- Publication number 20040193381
- Publication date Sep 30, 2004
- Hung-En Tai
- H01 - BASIC ELECTRIC ELEMENTS