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Chisato Kamiya

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  • Hitachinaka, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Electron beam device
    • Patent number 7,745,787
    • Issue date Jun 29, 2010
    • Hitachi High-Technologies Corporation
    • Chisato Kamiya
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged particle beam device with DF-STEM image valuation method
    • Patent number 7,459,683
    • Issue date Dec 2, 2008
    • Hitachi High-Technologies Corporation
    • Mine Araki
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Electron beam device
    • Patent number 7,355,177
    • Issue date Apr 8, 2008
    • Hitachi High-Technologies Corporation
    • Chisato Kamiya
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Electron beam device
    • Patent number 7,105,816
    • Issue date Sep 12, 2006
    • Hitachi High-Technologies Corporation
    • Chisato Kamiya
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

  • Information Patent Application

    Electron beam device
    • Publication number 20080290275
    • Publication date Nov 27, 2008
    • Chisato Kamiya
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged particle beam device with DF-STEM image valuation method
    • Publication number 20070085007
    • Publication date Apr 19, 2007
    • Hitachi High-Technologies Corporation
    • Mine Araki
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Electron beam device
    • Publication number 20060284093
    • Publication date Dec 21, 2006
    • Chisato Kamiya
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Electron beam device
    • Publication number 20040183017
    • Publication date Sep 23, 2004
    • Chisato Kamiya
    • H01 - BASIC ELECTRIC ELEMENTS