Chitomi Terayama

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit tester
- Patent number 6,505,312
- Issue date Jan 7, 2003
- Ando Electric Co., Ltd.
- Nobuaki Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Failure analysis device for IC tester and memory device measuring d...
- Patent number 5,978,949
- Issue date Nov 2, 1999
- Ando Electric Co., Ltd.
- Chitomi Terayama
- G11 - INFORMATION STORAGE