Chiung Wen Hsu

Person

Tainan City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and manufacturing method thereof
- Patent number 12,068,394
- Issue date Aug 20, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chia-Wei Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Etch profile control of isolation trench
- Patent number 12,040,219
- Issue date Jul 16, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Hsien-Chung Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method of manufacture
- Patent number 11,177,177
- Issue date Nov 16, 2021
- Taiwan Semiconductor Manufacturing Company Limited
- Fo-Ju Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with fin structures and manufacturing method t...
- Patent number 10,998,427
- Issue date May 4, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chia-Wei Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Manufacturing of semiconductor fin structure and manufacturing meth...
- Patent number 10,388,763
- Issue date Aug 20, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chia-Wei Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating isolation structure
- Patent number 10,199,258
- Issue date Feb 5, 2019
- United Microelectronics Corp.
- Chieh-Te Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of adjusting channel widths of semiconductive devices
- Patent number 9,548,216
- Issue date Jan 17, 2017
- United Microelectronics Corp.
- Yu-Te Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for achieving width control in etching processes
- Patent number 9,040,317
- Issue date May 26, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Keng-Ying Liao
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20240363730
- Publication date Oct 31, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Wei CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ETCH PROFILE CONTROL OF ISOLATION TRENCH
- Publication number 20240332062
- Publication date Oct 3, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsien-Chung HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING A SEMICONDUCTOR DEVICE
- Publication number 20240055526
- Publication date Feb 15, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yu-Chi LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ETCH PROFILE CONTROL OF ISOLATION TRENCH
- Publication number 20220301922
- Publication date Sep 22, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Hsien-Chung HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20210257484
- Publication date Aug 19, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Wei CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURE
- Publication number 20200176322
- Publication date Jun 4, 2020
- Taiwan Semiconductor Manufacturing Company Limited
- Fo-Ju LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20190371922
- Publication date Dec 5, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chia-Wei CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20180175173
- Publication date Jun 21, 2018
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chia-Wei CHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FABRICATING ISOLATION STRUCTURE
- Publication number 20180108563
- Publication date Apr 19, 2018
- United Microelectronics Corp.
- Chieh-Te Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF ADJUSTING CHANNEL WIDTHS OF SEMICONDUCTIVE DEVICES
- Publication number 20170025286
- Publication date Jan 26, 2017
- UNITED MICROELECTRONICS CORP.
- Yu-Te Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods for Achieving Width Control in Etching Processes
- Publication number 20130252355
- Publication date Sep 26, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Keng-Ying Liao
- H01 - BASIC ELECTRIC ELEMENTS

Chiung Wen Hsu

Person

Patents Grantslast 30 patents

Semiconductor device and manufacturing method thereof

Etch profile control of isolation trench

Semiconductor device and method of manufacture

Semiconductor device with fin structures and manufacturing method t...

Manufacturing of semiconductor fin structure and manufacturing meth...

Method of fabricating isolation structure

Method of adjusting channel widths of semiconductive devices

Methods for achieving width control in etching processes

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

ETCH PROFILE CONTROL OF ISOLATION TRENCH

SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING A SEMICONDUCTOR DEVICE

ETCH PROFILE CONTROL OF ISOLATION TRENCH

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURE

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

METHOD OF FABRICATING ISOLATION STRUCTURE

METHOD OF ADJUSTING CHANNEL WIDTHS OF SEMICONDUCTIVE DEVICES

Methods for Achieving Width Control in Etching Processes