Chizuru Inoshita

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Induction cooker and sensor unit
- Patent number 11,622,423
- Issue date Apr 4, 2023
- Mitsubishi Electric Corporation
- Chizuru Inoshita
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for testing a semiconductor integrated circuit
- Patent number 6,724,212
- Issue date Apr 20, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Chizuru Inoshita
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing a semiconductor integrated circuit when a differ...
- Patent number 6,674,300
- Issue date Jan 6, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Chizuru Inoshita
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing a semiconductor integrated circuit
- Patent number 6,563,323
- Issue date May 13, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Chizuru Inoshita
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit
- Patent number 6,477,115
- Issue date Nov 5, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Chizuru Inoshita
- G01 - MEASURING TESTING
Information Patent Grant
Power conserving CMOS semiconductor integrated circuit
- Patent number 6,456,114
- Issue date Sep 24, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Chizuru Inoshita
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method for testing a semiconductor integrated circuit when a differ...
- Patent number 6,446,231
- Issue date Sep 3, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Chizuru Inoshita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INDUCTION COOKER AND SENSOR UNIT
- Publication number 20200100332
- Publication date Mar 26, 2020
- Mitsubishi Electric Corporation
- Chizuru INOSHITA
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method for testing a semiconductor integrated circuit
- Publication number 20020186035
- Publication date Dec 12, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Chizuru Inoshita
- G01 - MEASURING TESTING
Information Patent Application
Method for testing a semiconductor integrated circuit
- Publication number 20020180476
- Publication date Dec 5, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Chizuru Inoshita
- G01 - MEASURING TESTING
Information Patent Application
Method for testing a semiconductor integrated circuit
- Publication number 20020180477
- Publication date Dec 5, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Chizuru Inoshita
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated device, and method of designing the same
- Publication number 20020079929
- Publication date Jun 27, 2002
- Chizuru Inoshita
- H03 - BASIC ELECTRONIC CIRCUITRY

Chizuru Inoshita

Person

Patents Grantslast 30 patents

Induction cooker and sensor unit

Method for testing a semiconductor integrated circuit

Method for testing a semiconductor integrated circuit when a differ...

Method for testing a semiconductor integrated circuit

Semiconductor integrated circuit

Power conserving CMOS semiconductor integrated circuit

Method for testing a semiconductor integrated circuit when a differ...

Patents Applicationslast 30 patents

INDUCTION COOKER AND SENSOR UNIT

Method for testing a semiconductor integrated circuit

Method for testing a semiconductor integrated circuit

Method for testing a semiconductor integrated circuit

Semiconductor integrated device, and method of designing the same