Cho TEH

Person

Los Altos, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Defect displaying method
- Patent number 11,416,979
- Issue date Aug 16, 2022
- ASML Netherlands B.V.
- Wei Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computer-implemented methods and systems for classifying defects on...
- Patent number 8,532,949
- Issue date Sep 10, 2013
- KLA-Tencor Technologies Corp.
- Cho Huak Teh
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for classification of defects using surface h...
- Patent number 8,502,146
- Issue date Aug 6, 2013
- KLA-Tencor Corporation
- Chien-Huei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Process excursion detection
- Patent number 8,289,510
- Issue date Oct 16, 2012
- KLA-Tencor Corporation
- Patrick Y. Huet
- G01 - MEASURING TESTING
Information Patent Grant
Process excursion detection
- Patent number 7,646,476
- Issue date Jan 12, 2010
- KLA-Tencor Corporation
- Patrick Y. Huet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Process excursion detection
- Patent number 7,394,534
- Issue date Jul 1, 2008
- KLA-Tencor Corporation
- Patrick Y. Huet
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR IMPROVING WAFER DEFECT CLASSIFICATION NUISA...
- Publication number 20250166161
- Publication date May 22, 2025
- ASML NETHERLANDS B.V.
- Hairong LEI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT DISPLAYING METHOD
- Publication number 20190370950
- Publication date Dec 5, 2019
- ASML Netherlands B,V.
- Wei FANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND APPARATUS FOR CLASSIFICATION OF DEFECTS USING SURFACE H...
- Publication number 20130082174
- Publication date Apr 4, 2013
- Chien-Huei CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHODS FOR REAL-TIME THREE-DIMENSIONAL SEM IMAGING A...
- Publication number 20120223227
- Publication date Sep 6, 2012
- Chien-Huei CHEN
- G01 - MEASURING TESTING
Information Patent Application
Process Excursion Detection
- Publication number 20110137576
- Publication date Jun 9, 2011
- KLA-Tencor Corporation
- Patrick Y. Huet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Process Excursion Detection
- Publication number 20100067781
- Publication date Mar 18, 2010
- KLA-Tencor Corporation
- Patrick Y. Huet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Process Excursion Detection
- Publication number 20080204739
- Publication date Aug 28, 2008
- KLA-Tencor Corporation
- Patrick Y. Huet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Computer-implemented methods and systems for classifying defects on...
- Publication number 20060082763
- Publication date Apr 20, 2006
- Cho Huak Teh
- G06 - COMPUTING CALCULATING COUNTING

Person

Patents Grantslast 30 patents

Defect displaying method

Computer-implemented methods and systems for classifying defects on...

Methods and apparatus for classification of defects using surface h...

Process excursion detection

Process excursion detection

Process excursion detection

Patents Applicationslast 30 patents

METHODS AND SYSTEMS FOR IMPROVING WAFER DEFECT CLASSIFICATION NUISA...

DEFECT DISPLAYING METHOD

METHODS AND APPARATUS FOR CLASSIFICATION OF DEFECTS USING SURFACE H...

APPARATUS AND METHODS FOR REAL-TIME THREE-DIMENSIONAL SEM IMAGING A...

Process Excursion Detection

Process Excursion Detection

Process Excursion Detection

Computer-implemented methods and systems for classifying defects on...