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Suzhou City, CN
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Patents Grants
last 30 patents
Information
Patent Grant
Test device
Patent number
12,117,484
Issue date
Oct 15, 2024
TECAT TECHNOLOGIES (SUZHOU) LIMITED
Choon Leong Lou
G01 - MEASURING TESTING
Information
Patent Grant
Probe card device having a probe structure with a protrusion portion
Patent number
11,965,912
Issue date
Apr 23, 2024
XINGR TECHNOLOGIES (ZHEJIANG) LIMITED
Choon Leong Lou
G01 - MEASURING TESTING
Information
Patent Grant
Probe card structure
Patent number
11,879,913
Issue date
Jan 23, 2024
XINZHUO TECHNOLOGY (ZHEJIANG) CO., LTD.
Choon Leong Lou
G01 - MEASURING TESTING
Information
Patent Grant
Testing device and probe elements thereof
Patent number
11,768,223
Issue date
Sep 26, 2023
TECAT TECHNOLOGIES (SUZHOU) LIMITED
Choon Leong Lou
G01 - MEASURING TESTING
Information
Patent Grant
High speed signal transmitting and receiving detection device
Patent number
11,567,104
Issue date
Jan 31, 2023
TECAT TECHNOLOGIES (SUZHOU) LIMITED
Choon Leong Lou
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TEST DEVICE
Publication number
20240036107
Publication date
Feb 1, 2024
teCat Technologies (Suzhou) Limited
CHOON LEONG LOU
G01 - MEASURING TESTING
Information
Patent Application
PROBE CARD STRUCTURE
Publication number
20230025864
Publication date
Jan 26, 2023
teCat Technologies (Suzhou) Limited
CHOON LEONG LOU
G01 - MEASURING TESTING
Information
Patent Application
ELASTIC PROBE ELEMENT, ELASTIC PROBE ASSEMBLY, AND TESTING DEVICE
Publication number
20220397587
Publication date
Dec 15, 2022
teCat Technologies (Suzhou) Limited
CHOON LEONG LOU
G01 - MEASURING TESTING
Information
Patent Application
TESTING DEVICE AND PROBE ELEMENTS THEREOF
Publication number
20220390487
Publication date
Dec 8, 2022
teCat Technologies (Suzhou) Limited
CHOON LEONG LOU
G01 - MEASURING TESTING
Information
Patent Application
PROBE STRUCTURE AND PROBE CARD DEVICE
Publication number
20220341969
Publication date
Oct 27, 2022
teCat Technologies (Suzhou) Limited
CHOON LEONG LOU
G01 - MEASURING TESTING
Information
Patent Application
TEST PROBE MODULE
Publication number
20220221490
Publication date
Jul 14, 2022
teCat Technologies (Suzhou) Limited
CHOON LEONG LOU
G01 - MEASURING TESTING
Information
Patent Application
HIGH SPEED SIGNAL TRANSMITTING AND RECEIVING DETECTION DEVICE
Publication number
20220221488
Publication date
Jul 14, 2022
teCat Technologies (Suzhou) Limited
CHOON LEONG LOU
G01 - MEASURING TESTING
Information
Patent Application
PROBE CARD DEVICE
Publication number
20220221491
Publication date
Jul 14, 2022
teCat Technologies (Suzhou) Limited
CHOON LEONG LOU
G01 - MEASURING TESTING