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Patents Grants
last 30 patents
Information
Patent Grant
Method and apparatus for cooling a semiconductor device
Patent number
9,917,034
Issue date
Mar 13, 2018
Semicaps Pte Ltd.
Choon Meng Chua
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method for cooling a semiconductor device
Patent number
8,891,240
Issue date
Nov 18, 2014
Semicaps Pte Ltd.
Choon Meng Chua
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Wafer stage
Patent number
8,436,631
Issue date
May 7, 2013
Semicaps Pte Ltd.
Choon Meng Chua
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method and system for measuring laser induced phenomena changes in...
Patent number
8,278,959
Issue date
Oct 2, 2012
Semicaps Pte Ltd.
Choon Meng Chua
G01 - MEASURING TESTING
Information
Patent Grant
Solid immersion lens optics assembly
Patent number
8,072,699
Issue date
Dec 6, 2011
Semicaps Pte Ltd.
Lian Ser Koh
G02 - OPTICS
Information
Patent Grant
Method of testing an electronic circuit and apparatus thereof
Patent number
7,623,982
Issue date
Nov 24, 2009
Semicaps Pte Ltd.
Choon Meng Chua
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for measuring laser induced phenomena changes in...
Patent number
7,456,032
Issue date
Nov 25, 2008
Semicaps Pte Ltd.
Choon Meng Chua
G01 - MEASURING TESTING
Information
Patent Grant
Laser beam induced phenomena detection
Patent number
6,897,664
Issue date
May 24, 2005
Advanced Micro Devices, Inc.
Michael Bruce
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND APPARATUS FOR COOLING A SEMICONDUCTOR DEVICE
Publication number
20160093554
Publication date
Mar 31, 2016
SEMICAPS PTE LTD.
Choon Meng CHUA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
WAFER STAGE
Publication number
20130241587
Publication date
Sep 19, 2013
SEMICAPS PTE LTD.
Choon Meng Chua
G01 - MEASURING TESTING
Information
Patent Application
SOLID IMMERSION LENS OPTICS ASSEMBLY
Publication number
20100321678
Publication date
Dec 23, 2010
SEMICAPS PTE LTD.
Lian Ser Koh
G02 - OPTICS
Information
Patent Application
WAFER STAGE
Publication number
20100315617
Publication date
Dec 16, 2010
SEMICAPS PTE LTD.
Choon Meng Chua
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHOD AND SYSTEM FOR MEASURING LASER INDUCED PHENOMENA CHANGES IN...
Publication number
20100156451
Publication date
Jun 24, 2010
SEMICAPS PTE LTD.
Choon Meng Chua
G01 - MEASURING TESTING
Information
Patent Application
Method and system for measuring laser induced phenomena changes in...
Publication number
20060284625
Publication date
Dec 21, 2006
SEMICAPS Pte Ltd
Choon Meng Chua
G01 - MEASURING TESTING